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Igor Kozhevnikov, Igor V. Kozhevnikov, Игорь Викторович Кожевников
Igor Kozhevnikov, Igor V. Kozhevnikov, Игорь Викторович Кожевников
Shubnikov Institute of Crystallography of the Russian Academy of Sciences
Подтвержден адрес электронной почты в домене crys.ras.ru
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Год
Design of X-ray supermirrors
IV Kozhevnikov, IN Bukreeva, E Ziegler
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2001
1372001
Зеркальная рентгеновская оптика
АВ Виноградов, ИА Брытов, АЯ Грудский, МТ Коган, ИВ Кожевников, ...
Ленинград, Машиностроение, 1989
121*1989
Phenomenon of total external reflection of x rays
AV Vinogradov, NN Zorev, IV Kozhevnikov, IG Yakushkin
Zh. Eksp. Teor. Fiz 89, 2124-2132, 1985
86*1985
Thermal stability of soft x-ray Mo-Si and MoSi2-Si multilayer mirrors
VV Kondratenko, Yu P Pershin, OV Poltseva, A I Fedorenko, EN Zubarev, SA ...
Applied Optics 32 (10), 1811-1816, 1993
841993
Application of X-ray scattering technique to the study of supersmooth surfaces
VE Asadchikov, IV Kozhevnikov, YS Krivonosov, R Mercier, TH Metzger, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2004
832004
Physical analysis of the inverse problem of X-ray reflectometry
IV Kozhevnikov
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2003
832003
Basic formulae of XUV multilayer optics
IV Kozhevnikov, AV Vinogradov
Physica Scripta 1987 (T17), 137, 1987
761987
Development of a self-consistent free-form approach for studying the three-dimensional morphology of a thin film
IV Kozhevnikov, L Peverini, E Ziegler
Physical Review B 85 (12), 125439, 2012
662012
Design and fabrication of depth-graded X-ray multilayers
C Morawe, E Ziegler, JC Peffen, IV Kozhevnikov
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2002
632002
Comparative study of the roughness of optical surfaces and thin films by use of x-ray scattering and atomic force microscopy
VE Asadchikov, A Duparré, S Jakobs, AY Karabekov, IV Kozhevnikov, ...
Applied Optics 38 (4), 684-691, 1999
631999
Use of DWBA and perturbation theory in X-ray control of the surface roughness
IV Kozhevnikov, MV Pyatakhin
Journal of X-ray science and technology 8 (4), 253-275, 1998
591998
Properties of broadband depth-graded multilayer mirrors for EUV optical systems
AE Yakshin, IV Kozhevnikov, E Zoethout, E Louis, F Bijkerk
Optics express 18 (7), 6957-6971, 2010
472010
Отражение и рассеяние рентгеновского излучения от шероховатых поверхностей
АВ Виноградов, ИВ Кожевников
Рентгеновская оптика (Труды ФИАН. Т.196) 196, 18-46, 1989
44*1989
Enhancement of soft X-ray reflectivity and interface stability in nitridated Pd/Y multilayer mirrors
D Xu, Q Huang, Y Wang, P Li, M Wen, P Jonnard, A Giglia, ...
Optics Express 23 (26), 33018-33026, 2015
422015
Condensation of silica nanoparticles on a phospholipid membrane
VE Asadchikov, VV Volkov, YO Volkov, KA Dembo, IV Kozhevnikov, ...
Jetp Letters 94, 585-587, 2011
40*2011
Synthesis and measurement of normal incidence X-ray multilayer mirrors optimized for a photon energy of 390 eV
IV Kozhevnikov, AI Fedorenko, VV Kondratenko, YP Pershin, SA Yulin, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1994
401994
Roughness conformity during tungsten film growth: An in situ synchrotron x-ray scattering study
L Peverini, E Ziegler, T Bigault, I Kozhevnikov
Physical Review B 72 (4), 045445, 2005
382005
Diffraction theory for grazing modes in concave mirrors and resonators at X-ray wavelengths. II
AV Vinogradov, VF Kovalev, IV Kozhevnikov, VV Pustovalov
Zhurnal Tekhnicheskoi Fiziki 55, 567-574, 1985
38*1985
Wideband multilayer mirrors with minimal layer thicknesses variation
IV Kozhevnikov, AE Yakshin, F Bijkerk
Optics express 23 (7), 9276-9283, 2015
352015
High-resolution, high-reflectivity operation of lamellar multilayer amplitude gratings: identification of the single-order regime
IV Kozhevnikov, R Van Der Meer, HMJ Bastiaens, KJ Boller, F Bijkerk
Optics express 18 (15), 16234-16242, 2010
352010
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