| FHIRChain: applying blockchain to securely and scalably share clinical data P Zhang, J White, DC Schmidt, G Lenz, ST Rosenbloom Computational and structural biotechnology journal 16, 267-278, 2018 | 588 | 2018 |
| Wreckwatch: Automatic traffic accident detection and notification with smartphones J White, C Thompson, H Turner, B Dougherty, DC Schmidt Mobile Networks and Applications 16, 285-303, 2011 | 463 | 2011 |
| Blockchain technology use cases in healthcare P Zhang, DC Schmidt, J White, G Lenz Advances in computers 111, 1-41, 2018 | 396 | 2018 |
| Applying machine learning classifiers to dynamic android malware detection at scale B Amos, H Turner, J White 2013 9th international wireless communications and mobile computing …, 2013 | 237 | 2013 |
| A genetic algorithm for optimized feature selection with resource constraints in software product lines J Guo, J White, G Wang, J Li, Y Wang Journal of Systems and Software 84 (12), 2208-2221, 2011 | 226 | 2011 |
| Metrics for assessing blockchain-based healthcare decentralized apps P Zhang, MA Walker, J White, DC Schmidt, G Lenz 2017 IEEE 19th international conference on e-health networking, applications …, 2017 | 223 | 2017 |
| Using smartphones to detect car accidents and provide situational awareness to emergency responders C Thompson, J White, B Dougherty, A Albright, DC Schmidt Mobile Wireless Middleware, Operating Systems, and Applications: Third …, 2010 | 223 | 2010 |
| Cyber-physical security challenges in manufacturing systems LJ Wells, JA Camelio, CB Williams, J White Manufacturing Letters 2 (2), 74-77, 2014 | 212 | 2014 |
| Model-driven auto-scaling of green cloud computing infrastructure B Dougherty, J White, DC Schmidt Future Generation Computer Systems 28 (2), 371-378, 2012 | 200 | 2012 |
| Automated diagnosis of product-line configuration errors in feature models J White, DC Schmidt, D Benavides, P Trinidad, A Ruiz–Cortés 2008 12th International Software Product Line Conference, 225-234, 2008 | 197 | 2008 |
| Cyber-physical vulnerabilities in additive manufacturing systems: A case study attack on the. STL file with human subjects LD Sturm, CB Williams, JA Camelio, J White, R Parker Journal of Manufacturing Systems 44, 154-164, 2017 | 184 | 2017 |
| High-precision vision-based mobile augmented reality system for context-aware architectural, engineering, construction and facility management (AEC/FM) applications H Bae, M Golparvar-Fard, J White Visualization in Engineering 1, 1-13, 2013 | 182 | 2013 |
| Selecting highly optimal architectural feature sets with filtered cartesian flattening J White, B Dougherty, DC Schmidt Journal of Systems and Software 82 (8), 1268-1284, 2009 | 168 | 2009 |
| Automated reasoning for multi-step feature model configuration problems J White, B Dougherty, DC Schmidt, DF Benavides Cuevas SPLC 2009: 13th International Software Product Line Conference (2009), p 11-20, 2009 | 163 | 2009 |
| Applying software patterns to address interoperability in blockchain-based healthcare apps P Zhang, J White, DC Schmidt, G Lenz arXiv preprint arXiv:1706.03700, 2017 | 158 | 2017 |
| Automated diagnosis of feature model configurations J White, D Benavides, DC Schmidt, P Trinidad, B Dougherty, ... Journal of Systems and Software 83 (7), 1094-1107, 2010 | 138 | 2010 |
| Cyber-physical vulnerabilities in additive manufacturing systems LD Sturm, CB Williams, JA Camelio, J White, R Parker 2014 International Solid Freeform Fabrication Symposium, 2014 | 121 | 2014 |
| Model transformation by demonstration Y Sun Proceedings of the 24th ACM SIGPLAN conference companion on Object oriented …, 2009 | 120 | 2009 |
| Improving domain-specific language reuse with software product line techniques J White, JH Hill, J Gray, S Tambe, AS Gokhale, DC Schmidt IEEE software 26 (4), 47-53, 2009 | 103 | 2009 |
| Automating product-line variant selection for mobile devices J White, DC Schmidt, E Wuchner, A Nechypurenko 11th International Software Product Line Conference (SPLC 2007), 129-140, 2007 | 102 | 2007 |
Douglas SchmidtCornelius Vanderbilt Professor at Vanderbilt UniversityVerified email at vanderbilt.edu
