| Scan Design and Secure Chip. D Hély, ML Flottes, F Bancel, B Rouzeyre, N Berard, M Renovell IOLTS 4, 219-224, 2004 | 203 | 2004 |
| Test control for secure scan designs D Hely, F Bancel, ML Flottes, B Rouzeyre European Test Symposium (ETS'05), 190-195, 2005 | 120 | 2005 |
| Run-time detection of hardware Trojans: The processor protection unit J Dubeuf, D Hély, R Karri 2013 18th IEEE European Test Symposium (ETS), 1-6, 2013 | 57 | 2013 |
| Secure scan techniques: a comparison D Hely, F Bancel, ML Flottes, B Rouzeyre 12th IEEE International On-Line Testing Symposium (IOLTS'06), 6 pp., 2006 | 56 | 2006 |
| Hardware trojan detection using an advised genetic algorithm based logic testing MA Nourian, M Fazeli, D Hély Journal of Electronic Testing 34, 461-470, 2018 | 55 | 2018 |
| Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model JM Dutertre, V Beroulle, P Candelier, S De Castro, LB Faber, ML Flottes, ... 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), 1-6, 2018 | 54 | 2018 |
| Securing scan control in crypto chips D Hély, F Bancel, ML Flottes, B Rouzeyre Journal of Electronic Testing 23 (5), 457-464, 2007 | 54 | 2007 |
| Key reconciliation protocols for error correction of silicon PUF responses B Colombier, L Bossuet, V Fischer, D Hély IEEE Transactions on Information Forensics and Security 12 (8), 1988-2002, 2017 | 42 | 2017 |
| Voltage glitch attacks on mixed-signal systems N Beringuier-Boher, K Gomina, D Hely, JB Rigaud, V Beroulle, A Tria, ... 2014 17th Euromicro Conference on Digital System Design, 379-386, 2014 | 37 | 2014 |
| A multiple fault injection methodology based on cone partitioning towards RTL modeling of laser attacks A Papadimitriou, D Hély, V Beroulle, P Maistri, R Leveugle 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-4, 2014 | 35 | 2014 |
| Hardware security evaluation platform for MCU-based connected devices: application to healthcare IoT Z Kazemi, A Papadimitriou, D Hely, M Fazcli, V Beroulle 2018 IEEE 3rd International Verification and Security Workshop (IVSW), 87-92, 2018 | 33 | 2018 |
| Machine learning and hardware security: Challenges and opportunities F Regazzoni, S Bhasin, AA Pour, I Alshaer, F Aydin, A Aysu, V Beroulle, ... Proceedings of the 39th International Conference on Computer-Aided Design, 1-6, 2020 | 30 | 2020 |
| Authentication using metallic inkjet-printed chipless RFID tags Z Ali, E Perret, N Barbot, R Siragusa, D Hely, M Bernier, F Garet IEEE Transactions on Antennas and Propagation 68 (5), 4137-4142, 2019 | 27 | 2019 |
| On the performance of non-profiled differential deep learning attacks against an AES encryption algorithm protected using a correlated noise generation based hiding countermeasure A Alipour, A Papadimitriou, V Beroulle, E Aerabi, D Hély 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 614-617, 2020 | 26 | 2020 |
| RFID System On-line Testing based on the evaluation of the Tags Read-Error-Rate G Fritz, V Beroulle, OEK Aktouf, MD Nguyen, D Hély Journal of Electronic Testing 27, 267-276, 2011 | 26 | 2011 |
| On a low cost fault injection framework for security assessment of cyber-physical systems: Clock glitch attacks Z Kazemi, A Papadimitriou, I Souvatzoglou, E Aerabi, MM Ahmed, D Hely, ... 2019 IEEE 4th International Verification and Security Workshop (IVSW), 7-12, 2019 | 22 | 2019 |
| A secure scan design methodology D Hely, F Bancel, ML Flottes, B Rouzeyre Proceedings of the Design Automation & Test in Europe Conference 1, 1-2, 2006 | 22 | 2006 |
| Laser-induced fault effects in security-dedicated circuits R Leveugle, P Maistri, P Vanhauwaert, F Lu, G Di Natale, ML Flottes, ... 2014 22nd International Conference on Very Large Scale Integration (VLSI-SoC …, 2014 | 21 | 2014 |
| Cryptography with analog scheme using memristors B Cambou, D Hély, S Assiri ACM Journal on Emerging Technologies in Computing Systems (JETC) 16 (4), 1-30, 2020 | 20 | 2020 |
| Hardware security vulnerability assessment to identify the potential risks in a critical embedded application Z Kazemi, M Fazeli, D Hely, V Beroulle 2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020 | 20 | 2020 |
Vincent BeroulleGrenoble INP - Univ. Grenoble AlpesVerified email at lcis.grenoble-inp.fr
