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David Biegelsen
David Biegelsen
Xerox Palo Alto Research Center
Verified email at parc.com
Title
Cited by
Cited by
Year
Surface reconstructions of GaAs (100) observed by scanning tunneling microscopy
DK Biegelsen, RD Bringans, JE Northrup, LE Swartz
Physical Review B 41 (9), 5701, 1990
8441990
Electronic traps and Pb centers at the Si/SiO2 interface: Band‐gap energy distribution
EH Poindexter, GJ Gerardi, ME Rueckel, PJ Caplan, NM Johnson, ...
Journal of applied physics 56 (10), 2844-2849, 1984
4401984
Luminescence studies of plasma-deposited hydrogenated silicon
RA Street, JC Knights, DK Biegelsen
Physical Review B 18 (4), 1880, 1978
4181978
Self‐limiting oxidation for fabricating sub‐5 nm silicon nanowires
HI Liu, DK Biegelsen, FA Ponce, NM Johnson, RFW Pease
Applied physics letters 64 (11), 1383-1385, 1994
3881994
Silicon surface passivation by hydrogen termination: A comparative study of preparation methods
DB Fenner, DK Biegelsen, RD Bringans
Journal of Applied Physics 66 (1), 419-424, 1989
3591989
Detailed investigation of doping in hydrogenated amorphous silicon and germanium
M Stutzmann, DK Biegelsen, RA Street
Physical Review B 35 (11), 5666, 1987
3541987
Reconstructions of GaAs (1 1 1) surfaces observed by scanning tunneling microscopy
DK Biegelsen, RD Bringans, JE Northrup, LE Swartz
Physical Review Letters 65 (4), 452, 1990
3481990
Defect states in doped and compensated a-Si: H
RA Street, DK Biegelsen, JC Knights
Physical Review B 24 (2), 969, 1981
3321981
Deuterium passivation of grain‐boundary dangling bonds in silicon thin films
NM Johnson, DK Biegelsen, MD Moyer
Applied Physics Letters 40 (10), 882-884, 1982
3031982
Hydrogen evolution and defect creation in amorphous Si: H alloys
DK Biegelsen, RA Street, CC Tsai, JC Knights
Physical Review B 20 (12), 4839, 1979
2971979
Apparatus and method for using electrostatic force to cause fluid movement
SA Elrod, E Peeters, FE Torres, DK Biegelsen, JL Dunec, AG Bell
US Patent 7,147,763, 2006
2882006
Stretchable interconnects using stress gradient films
DK Biegelsen, D Fork, J Reich
US Patent 6,743,982, 2004
2852004
Density of gap states of silicon grain boundaries determined by optical absorption
WB Jackson, NM Johnson, DK Biegelsen
Applied physics letters 43 (2), 195-197, 1983
2851983
Luminescence and ESR studies of defects in hydrogenated amorphous silicon
RA Street, DK Biegelsen
Solid State Communications 33 (12), 1159-1162, 1980
2251980
Photoinduced defects in chalcogenide glasses
DK Biegelsen, RA Street
Physical Review Letters 44 (12), 803, 1980
2241980
Characteristic electronic defects at the Si‐SiO2 interface
NM Johnson, DK Biegelsen, MD Moyer, ST Chang, EH Poindexter, ...
Applied Physics Letters 43 (6), 563-565, 1983
2201983
Self‐limiting oxidation of Si nanowires
HI Liu, DK Biegelsen, NM Johnson, FA Ponce, RFW Pease
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1993
2181993
Initial stages of epitaxial growth of GaAs on (100) silicon
DK Biegelsen, FA Ponce, AJ Smith, JC Tramontana
Journal of applied physics 61 (5), 1856-1859, 1987
2051987
Microdevice valve structures to fluid control
DK Biegelsen, WB Jackson, PCP Cheung, MH Yim, AA Berlin
US Patent 5,971,355, 1999
1871999
Hyperfine studies of dangling bonds in amorphous silicon
DK Biegelsen, M Stutzmann
Physical Review B 33 (5), 3006, 1986
1711986
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