Andrea Cester
Andrea Cester
Department of Information Engineering, Padova University
Подтвержден адрес электронной почты в домене dei.unipd.it - Главная страница
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Процитировано
Процитировано
Год
Radiation induced leakage current and stress induced leakage current in ultra-thin gate oxides
M Ceschia, A Paccagnella, A Cester, A Scarpa, G Ghidini
IEEE Transactions on Nuclear Science 45 (6), 2375-2382, 1998
1751998
Trapping phenomena in AlGaN/GaN HEMTs: a study based on pulsed and transient measurements
G Meneghesso, M Meneghini, D Bisi, I Rossetto, A Cester, UK Mishra, ...
Semiconductor Science and Technology 28 (7), 074021, 2013
732013
Accelerated wear-out of ultra-thin gate oxides after irradiation
A Cester, S Cimino, A Paccagnella, G Ghibaudo, G Ghidini, J Wyss
IEEE Transactions on Nuclear Science 50 (3), 729-734, 2003
522003
Noise characteristics of radiation-induced soft breakdown current in ultrathin gate oxides
A Cester, L Bandiera, M Ceschia, G Ghidini, A Paccagnella
IEEE Transactions on Nuclear Science 48 (6), 2093-2100, 2001
462001
Drain current decrease in MOSFETs after heavy ion irradiation
A Cester, S Gerardin, A Paccagnella, JR Schwank, G Vizkelethy, ...
IEEE transactions on nuclear science 51 (6), 3150-3157, 2004
442004
Thermal stress effects on dye-sensitized solar cells (DSSCs)
D Bari, N Wrachien, R Tagliaferro, S Penna, TM Brown, A Reale, ...
Microelectronics Reliability 51 (9-11), 1762-1766, 2011
422011
Flexible and Organic Neural Interfaces: A Review
N Lago, A Cester
Applied Sciences 7 (12), 1292, 2017
372017
Collapse of MOSFET drain current after soft breakdown and its dependence on the transistor aspect ratio W/L
A Cester, S Cimino, A Paccagnella, G Ghidini, G Guegan
2003 IEEE International Reliability Physics Symposium Proceedings, 2003 …, 2003
372003
Collapse of MOSFET drain current after soft breakdown
A Cester, A Paccagnella, G Ghidini, S Deleonibus, G Guegan
IEEE Transactions on Device and Materials Reliability 4 (1), 63-72, 2004
352004
Influence of shunt resistance on the performance of an illuminated string of solar cells: theory, simulation, and experimental analysis
M Barbato, M Meneghini, A Cester, G Mura, E Zanoni, G Meneghesso
IEEE Transactions on Device and Materials Reliability 14 (4), 942-950, 2014
302014
Worldwide outdoor round robin study of organic photovoltaic devices and modules
MV Madsen, SA Gevorgyan, R Pacios, J Ajuria, I Etxebarria, J Kettle, ...
Solar energy materials and solar cells 130, 281-290, 2014
292014
Worldwide Outdoor Round Robin Study of Organic Photovoltaic Devices and Modules
Solar Energy Materials and Solar Cells 130, 281-290, 2014
292014
Thermal and electrical stress effects of electrical and optical characteristics of Alq3/NPD OLED
A Cester, D Bari, J Framarin, N Wrachien, G Meneghesso, S Xia, ...
Microelectronics Reliability 50 (9-11), 1866-1870, 2010
282010
Impact of heavy-ion strikes on minimum-size MOSFETs with ultra-thin gate oxide
S Gerardin, M Bagatin, A Cester, A Paccagnella, B Kaczer
IEEE transactions on nuclear science 53 (6), 3675-3680, 2006
272006
Statistical model for radiation-induced wear-out of ultra-thin gate oxides after exposure to heavy ion irradiation
A Cester, S Cimino, E Miranda, A Candelori, G Ghidini, A Paccagnella
IEEE Transactions on Nuclear Science 50 (6), 2167-2175, 2003
272003
Total dose dependence of radiation-induced leakage current in ultra-thin gate oxides
M Ceschia, A Paccagnella, A Scarpa, A Cester, G Ghidini
Microelectronics Reliability 39 (2), 221-226, 1999
271999
High-voltage double-pulsed measurement system for GaN-based power HEMTs
D Bisi, A Stocco, M Meneghini, F Rampazzo, A Cester, G Meneghesso, ...
2014 IEEE International Reliability Physics Symposium, CD. 11.1-CD. 11.4, 2014
252014
Impact of 24-GeV proton irradiation on 0.13-μm CMOS devices
S Gerardin, A Gasperin, A Cester, A Paccagnella, G Ghidini, A Candelori, ...
2005 8th European Conference on Radiation and Its Effects on Components and …, 2005
252005
Total ionizing dose effects on 4 Mbit phase change memory arrays
A Gasperin, N Wrachien, A Paccagnella, F Ottogalli, U Corda, P Fuochi, ...
IEEE Transactions on Nuclear Science 55 (4), 2090-2097, 2008
242008
Systematic characterization of soft-and hard-breakdown spots using techniques with nanometer resolution
M Porti, S Gerardin, M Nafrı, X Aymerich, A Cester, A Paccagnella, ...
Microelectronic engineering 84 (9-10), 1956-1959, 2007
242007
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