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George Papaioannou
George Papaioannou
University of Athens, Solid State Physics Section
Подтвержден адрес электронной почты в домене phys.uoa.gr - Главная страница
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Процитировано
Год
Temperature study of the dielectric polarization effects of capacitive RF MEMS switches
G Papaioannou, MN Exarchos, V Theonas, G Wang, J Papapolymerou
IEEE Transactions on Microwave Theory and Techniques 53 (11), 3467-3473, 2005
1352005
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions
U Zaghloul, G Papaioannou, F Coccetti, P Pons, R Plana
Microelectronics Reliability 49 (9-11), 1309-1314, 2009
772009
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation
M Lamhamdi, P Pons, U Zaghloul, L Boudou, F Coccetti, J Guastavino, ...
Microelectronics Reliability 48 (8-9), 1248-1252, 2008
752008
On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization …
U Zaghloul, G Papaioannou, B Bhushan, F Coccetti, P Pons, R Plana
Microelectronics Reliability 51 (9-11), 1810-1818, 2011
662011
Structure dependent charging process in RF MEMS capacitive switches
E Papandreou, M Lamhamdi, CM Skoulikidou, P Pons, G Papaioannou, ...
Microelectronics Reliability 47 (9-11), 1812-1817, 2007
622007
On the influence of environment gases, relative humidity and gas purification on dielectric charging/discharging processes in electrostatically driven MEMS/NEMS devices
U Zaghloul, B Bhushan, P Pons, GJ Papaioannou, F Coccetti, R Plana
Nanotechnology 22 (3), 035705, 2010
582010
Dielectric charging in radio frequency microelectromechanical system capacitive switches: A study of material properties and device performance
G Papaioannou, J Papapolymerou, P Pons, R Plana
Applied Physics Letters 90 (23), 2007
562007
Effect of deposition conditions on charging processes in SiNx: Application to RF-MEMS capacitive switches
R Daigler, E Papandreou, M Koutsoureli, G Papaioannou, ...
Microelectronic Engineering 86 (3), 404-407, 2009
552009
A systematic reliability investigation of the dielectric charging process in electrostatically actuated MEMS based on Kelvin probe force microscopy
U Zaghloul, GJ Papaioannou, F Coccetti, P Pons, R Plana
Journal of Micromechanics and Microengineering 20 (6), 064016, 2010
382010
On the modeling of dielectric charging in RF-MEMS capacitive switches
G Papaioannou, F Coccetti, R Plana
2010 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems …, 2010
382010
The operating performance of firms that switch their stock listings
GJ Papaioannou, NG Travlos, KG Viswanathan
Journal of Financial Research 26 (4), 469-486, 2003
382003
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches
A Belarni, M Lamhamdi, P Pons, L Boudou, J Guastavino, Y Segui, ...
Microelectronics Reliability 48 (8-9), 1232-1236, 2008
372008
Contactless dielectric charging mechanisms in RF-MEMS capacitive switches
GJ Papaioannou, G Wang, D Bessas, J Papapolymerou
2006 European Microwave Integrated Circuits Conference, 513-516, 2006
372006
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques
U Zaghloul, M Koutsoureli, H Wang, F Coccetti, G Papaioannou, P Pons, ...
Microelectronics Reliability 50 (9-11), 1615-1620, 2010
342010
A study of field emission process in electrostatically actuated MEMS switches
L Michalas, A Garg, A Venkattraman, M Koutsoureli, A Alexeenko, ...
Microelectronics Reliability 52 (9-10), 2267-2271, 2012
332012
ESD failure signature in capacitive RF MEMS switches
J Ruan, GJ Papaioannou, N Nolhier, N Mauran, M Bafleur, F Coccetti, ...
Microelectronics reliability 48 (8-9), 1237-1240, 2008
332008
Effect of space charge polarization in radio frequency microelectromechanical system capacitive switch dielectric charging
GJ Papaioannou, M Exarchos, V Theonas, J Psychias, G Konstantinidis, ...
Applied Physics Letters 89 (10), 2006
332006
Nanoscale characterization of different stiction mechanisms in electrostatically driven MEMS devices based on adhesion and friction measurements
U Zaghloul, B Bhushan, P Pons, GJ Papaioannou, F Coccetti, R Plana
Journal of colloid and interface science 358 (1), 1-13, 2011
322011
Nanoscale characterization of the dielectric charging phenomenon in PECVD silicon nitride thin films with various interfacial structures based on Kelvin probe force microscopy
U Zaghloul, GJ Papaioannou, H Wang, B Bhushan, F Coccetti, P Pons, ...
Nanotechnology 22 (20), 205708, 2011
322011
Investigation of charging mechanisms in Metal-Insulator-Metal structures
M Exarchos, V Theonas, P Pons, GJ Papaioannou, S Melle, D Dubuc, ...
Microelectronics Reliability 45 (9-11), 1782-1785, 2005
322005
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