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James Moyne
James Moyne
Associate Research Scientist, University of Michigan
Подтвержден адрес электронной почты в домене umich.edu
Название
Процитировано
Процитировано
Год
Performance evaluation of control networks: Ethernet, ControlNet, and DeviceNet
FL Lian, JR Moyne, DM Tilbury
IEEE control systems magazine 21 (1), 66-83, 2001
9102001
Network design consideration for distributed control systems
FL Lian, J Moyne, D Tilbury
IEEE transactions on control systems technology 10 (2), 297-307, 2002
8052002
Using deadbands to reduce communication in networked control systems
PG Otanez, JR Moyne, DM Tilbury
Proceedings of the 2002 American Control Conference (IEEE Cat. No. CH37301 …, 2002
4482002
The emergence of industrial control networks for manufacturing control, diagnostics, and safety data
JR Moyne, DM Tilbury
Proceedings of the IEEE 95 (1), 29-47, 2007
4282007
Run-to-run control in semiconductor manufacturing
J Moyne
Encyclopedia of Systems and Control, 1997-2003, 2021
3482021
Big data analytics for smart manufacturing: Case studies in semiconductor manufacturing
J Moyne, J Iskandar
Processes 5 (3), 39, 2017
2272017
Run by run control of chemical-mechanical polishing
DS Boning, WP Moyne, TH Smith, J Moyne, R Telfeyan, A Hurwitz, ...
IEEE Transactions on Components, Packaging, and Manufacturing Technology …, 1996
2141996
An approach for factory-wide control utilizing virtual metrology
AA Khan, JR Moyne, DM Tilbury
IEEE Transactions on semiconductor Manufacturing 20 (4), 364-375, 2007
2002007
Modelling and optimal controller design of networked control systems with multiple delays
FL Lian, J Moyne, D Tilbury
International Journal of Control 76 (6), 591-606, 2003
1962003
Analysis and modeling of networked control systems: MIMO case with multiple time delays
FL Lian, J Moyne, D Tilbury
Proceedings of the 2001 American Control Conference.(Cat. No. 01CH37148) 6 …, 2001
1792001
Virtual metrology and feedback control for semiconductor manufacturing processes using recursive partial least squares
AA Khan, JR Moyne, DM Tilbury
Journal of Process Control 18 (10), 961-974, 2008
1672008
A requirements driven digital twin framework: Specification and opportunities
J Moyne, Y Qamsane, EC Balta, I Kovalenko, J Faris, K Barton, DM Tilbury
IEEE Access 8, 107781-107801, 2020
1492020
Optimal controller design and evaluation for a class of networked control systems with distributed constant delays
FL Lian, J Moyne, D Tilbury
Proceedings of the 2002 American Control Conference (IEEE Cat. No. CH37301 …, 2002
1082002
Generic cell controlling method and apparatus for computer integrated manufacturing system
JR Moyne
US Patent 5,469,361, 1995
1021995
Control of semiconductor manufacturing equipment: Real-time feedback control of a reactive ion etcher
BA Rashap, ME Elta, H Etemad, JP Fournier, JS Freudenberg, MD Giles, ...
IEEE Transactions on Semiconductor Manufacturing 8 (3), 286-297, 1995
1021995
Network architecture and communication modules for guaranteeing acceptable control and communication performance for networked multi-agent systems
FL Lian, JK Yook, DM Tilbury, J Moyne
IEEE Transactions on Industrial Informatics 2 (1), 12-24, 2006
982006
A unified digital twin framework for real-time monitoring and evaluation of smart manufacturing systems
Y Qamsane, CY Chen, EC Balta, BC Kao, S Mohan, J Moyne, D Tilbury, ...
2019 IEEE 15th international conference on automation science and …, 2019
892019
Big data capabilities applied to semiconductor manufacturing advanced process control
J Moyne, J Samantaray, M Armacost
IEEE transactions on semiconductor manufacturing 29 (4), 283-291, 2016
822016
An extended database design methodology for uncertain data management
N Chaudhry, J Moyne, EA Rundensteiner
Information sciences 121 (1-2), 83-112, 1999
791999
A comparative analysis of run-to-run control algorithms in the semiconductor manufacturing industry
Z Ning, JR Moyne, T Smith, D Boning, E Del Castillo, JY Yeh, A Hurwitz
IEEE/SEMI 1996 Advanced Semiconductor Manufacturing Conference and Workshop …, 1996
731996
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