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Frédéric Darracq
Frédéric Darracq
Associate professor, Bordeaux university
Verified email at ims-bordeaux.fr
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Year
Backside SEU laser testing for commercial off-the-shelf SRAMs
F Darracq, H Lapuyade, N Buard, F Mounsi, B Foucher, P Fouillat, ...
IEEE Transactions on Nuclear Science 49 (6), 2977-2983, 2002
792002
Influence of laser pulse duration in single event upset testing
A Douin, V Pouget, F Darracq, D Lewis, P Fouillat, P Perdu
2005 8th European Conference on Radiation and Its Effects on Components and …, 2005
702005
Terahertz imaging and tomography as efficient instruments for testing polymer additive manufacturing objects
JB Perraud, AF Obaton, J Bou-Sleiman, B Recur, H Balacey, F Darracq, ...
Applied optics 55 (13), 3462-3467, 2016
612016
Art painting diagnostic before restoration with terahertz and millimeter waves
JP Guillet, M Roux, K Wang, X Ma, F Fauquet, H Balacey, B Recur, ...
Journal of Infrared, Millimeter, and Terahertz Waves 38, 369-379, 2017
512017
Investigation on the SEL sensitive depth of an SRAM using linear and two-photon absorption laser testing
E Faraud, V Pouget, K Shao, C Larue, F Darracq, D Lewis, A Samaras, ...
IEEE Transactions on Nuclear Science 58 (6), 2637-2643, 2011
472011
Laser cross section measurement for the evaluation of single-event effects in integrated circuits
V Pouget, P Fouillat, D Lewis, H Lapuyade, F Darracq, A Touboul
Microelectronics Reliability 40 (8-10), 1371-1375, 2000
362000
Evaluation of recent technologies of non-volatile RAM
T Nuns, S Duzellier, J Bertrand, G Hubert, V Pouget, F Darracq, JP David, ...
2007 9th European Conference on Radiation and Its Effects on Components and …, 2007
322007
Fundamentals of the pulsed laser technique for single-event upset testing
P Fouillat, V Pouget, D McMorrow, F Darracq, S Buchner, D Lewis
Radiation Effects on Embedded Systems, 121-141, 2007
262007
THE HARDNESS-INTENSITY CORRELATION IN BRIGHT GAMMA-RAY BURSTS
AK J.-P. Dezalay, J.-L. Atteia, C. Barat, M. Boer, F. Darracq, P. Goupil, M ...
The Astrophysical Journal 490 (1), L17-L20, 1997
261997
Single-event sensitivity of a single SRAM cell
F Darracq, T Beauchene, V Pouget, H Lapuyade, D Lewis, P Fouillat, ...
IEEE Transactions on Nuclear Science 49 (3), 1486-1490, 2002
252002
TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices
K Mukherjee, F Darracq, A Curutchet, N Malbert, N Labat
Microelectronics Reliability 76, 350-356, 2017
202017
Characterization and modeling of laser-induced single-event burn-out in SiC power diodes
N Mbaye, V Pouget, F Darracq, D Lewis
Microelectronics Reliability 53 (9-11), 1315-1319, 2013
172013
Low-frequency noise effect on terahertz tomography using thermal detectors
JP Guillet, B Recur, H Balacey, JB Sleiman, F Darracq, D Lewis, ...
Applied optics 54 (22), 6758-6762, 2015
152015
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell
I El Moukhtari, V Pouget, C Larue, F Darracq, D Lewis, P Perdu
Microelectronics Reliability 53 (9-11), 1325-1328, 2013
132013
Investigation on the single event burnout sensitive volume using two-photon absorption laser testing
F Darracq, N Mbaye, S Azzopardi, V Pouget, E Lorfevre, F Bezerra, ...
IEEE Transactions on Nuclear Science 59 (4), 999-1006, 2012
132012
Imaging the single event burnout sensitive volume of vertical power MOSFETs using the laser two-photon absorption technique
F Darracq, N Mbaye, C Larue, V Pouget, S Azzopardi, E Lorfevre, ...
2011 12th European Conference on Radiation and Its Effects on Components and …, 2011
132011
Investigation of single event burnout sensitive depth in power MOSFETS
F Darracq, V Pouget, D Lewis, P Fouillat, E Lorfevre, R Ecoffet, F Bezerra
2009 European Conference on Radiation and Its Effects on Components and …, 2009
132009
Optimizing pulsed OBIC technique for ESD defect localization
F Essely, N Guitard, F Darracq, V Pouget, M Bafleur, P Perdu, A Touboul, ...
IEEE Transactions on Device and Materials Reliability 7 (4), 617-624, 2007
122007
Analysis of short-term NBTI effect on the Single-Event Upset sensitivity of a 65nm SRAM using two-photon absorption
I El Moukhtari, V Pouget, F Darracq, C Larue, D Lewis, P Perdu
2013 14th European Conference on Radiation and Its Effects on Components and …, 2013
112013
A non-linear model to express laser-induced SRAM cross-sections versus an effective laser LET
F Darracq, H Lapuyade, V Pouget, P Fouillat
Radiation and its Effects on Components and Systems, RADECS 2003 …, 2004
112004
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