| Ultra-low-loss high-aspect-ratio Si3N4 waveguides JF Bauters, MJR Heck, D John, D Dai, MC Tien, JS Barton, A Leinse, ... Optics express 19 (4), 3163-3174, 2011 | 530 | 2011 |
| Silicon ring isolators with bonded nonreciprocal magneto-optic garnets MC Tien, T Mizumoto, P Pintus, H Kromer, JE Bowers Optics express 19 (12), 11740-11745, 2011 | 281 | 2011 |
| Ultra-high quality factor planar Si3N4 ring resonators on Si substrates MC Tien, JF Bauters, MJR Heck, DT Spencer, DJ Blumenthal, JE Bowers Optics express 19 (14), 13551-13556, 2011 | 180 | 2011 |
| Low-loss Si3N4 arrayed-waveguide grating (de)multiplexer using nano-core optical waveguides D Dai, Z Wang, JF Bauters, MC Tien, MJR Heck, DJ Blumenthal, ... Optics express 19 (15), 14130-14136, 2011 | 159 | 2011 |
| Ultra-low loss Si3N4 waveguides with low nonlinearity and high power handling capability MC Tien, JF Bauters, MJR Heck, DJ Blumenthal, JE Bowers Optics express 18 (23), 23562-23568, 2010 | 92 | 2010 |
| Organic light emitting diode circuit having voltage compensation function and method for compensating HR Guo, CC Yang, MC Tien US Patent App. 11/247,106, 2006 | 41 | 2006 |
| Design of magneto-optical ring isolator on SOI based on the finite-element method P Pintus, MC Tien, JE Bowers IEEE Photonics Technology Letters 23 (22), 1670-1672, 2011 | 37 | 2011 |
| Heterogeneous integration of InGaAsP microdisk laser on a silicon platform using optofluidic assembly MC Tien, AT Ohta, K Yu, SL Neale, MC Wu Applied Physics A 95, 967-972, 2009 | 35 | 2009 |
| Ultra-low-loss single-mode Si3N4 waveguides with 0.7 dB/m propagation loss JF Bauters, MJR Heck, DD John, MC Tien, W Li, JS Barton, ... European conference and exposition on optical communications, Th. 12 …, 2011 | 33 | 2011 |
| Ultra-low loss silica-based waveguides with millimeter bend radius JF Bauters, MJR Heck, D John, MC Tien, A Leinse, RG Heideman, ... 36th European Conference and Exhibition on Optical Communication, 1-3, 2010 | 30 | 2010 |
| Edge-coupled membrane terahertz photonic transmitters based on metal–semiconductor–metal traveling-wave photodetectors JW Shi, SW Chu, MC Tien, CK Sun, YJ Chiu, JE Bowers Applied Physics Letters 81 (27), 5108-5110, 2002 | 28 | 2002 |
| Device saturation behavior of submillimeter-wave membrane photonic transmitters MC Tien, HH Chang, JY Lu, LJ Chen, SY Chen, RB Wu, WS Liu, JI Chyi, ... IEEE Photonics Technology Letters 16 (3), 873-875, 2004 | 22 | 2004 |
| Traveling-wave photodetectors with high power-bandwidth and gain-bandwidth product performance D Lasaosa, JW Shi, D Pasquariello, KG Gan, MC Tien, HH Chang, ... IEEE Journal of selected topics in quantum electronics 10 (4), 728-741, 2004 | 17 | 2004 |
| Optoelectronic-based high-efficiency quasi-CW terahertz imaging JY Lu, HH Chang, LJ Chen, MC Tien, CK Sun IEEE Photonics technology letters 17 (11), 2406-2408, 2005 | 15 | 2005 |
| Ring resonator based optical isolator and circulator H Kroemer, JE Bowers, MC Tien US Patent 8,396,337, 2013 | 14 | 2013 |
| Polarization characteristics of low-loss nano-core buried optical waveguides and directional couplers D Dai, Z Wang, JF Bauters, MC Tien, MJR Heck, DJ Blumenthal, ... 7th IEEE International Conference on Group IV Photonics, 260-262, 2010 | 13 | 2010 |
| Three-dimensional electric field visualization utilizing electric-field-induced second-harmonic generation in nematic liquid crystals IH Chen, SW Chu, F Bresson, MC Tien, JW Shi, CK Sun Optics letters 28 (15), 1338-1340, 2003 | 12 | 2003 |
| Overview of stitching for high NA: imaging and overlay experimental and simulation results N Davydova, L van Look, V Wiaux, J Bekaert, F Timmermans, ... Optical and EUV Nanolithography XXXVI 12494, 233-251, 2023 | 9 | 2023 |
| Stitching for High NA: new insights and path forward NV Davydova, V Wiaux, J Bekaert, FJ Timmermans, B Slachter, ... International Conference on Extreme Ultraviolet Lithography 2022, PC1229210, 2022 | 9 | 2022 |
| The use of computational inspection to identify process window limiting hotspots and predict sub-15nm defects with high capture rate BH Ham, IH Kim, SS Park, SY Yeo, SJ Kim, DW Park, JS Park, CH Ryu, ... Metrology, Inspection, and Process Control for Microlithography XXXI 10145 …, 2017 | 9 | 2017 |
