| A style-aware content loss for real-time hd style transfer A Sanakoyeu*, D Kotovenko*, S Lang, B Ommer proceedings of the European conference on computer vision (ECCV), 698-714, 2018 | 266 | 2018 |
| Content and style disentanglement for artistic style transfer D Kotovenko, A Sanakoyeu, S Lang, B Ommer Proceedings of the IEEE/CVF international conference on computer vision …, 2019 | 180 | 2019 |
| A content transformation block for image style transfer D Kotovenko, A Sanakoyeu, P Ma, S Lang, B Ommer Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2019 | 100 | 2019 |
| Rethinking style transfer: From pixels to parameterized brushstrokes D Kotovenko*, M Wright*, A Heimbrecht, B Ommer Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2021 | 76 | 2021 |
| Depthfm: Fast monocular depth estimation with flow matching M Gui, JS Fischer, U Prestel, P Ma, D Kotovenko, O Grebenkova, ... arXiv preprint arXiv:2403.13788, 2024 | 19 | 2024 |
| Coherentgs: Sparse novel view synthesis with coherent 3d gaussians A Paliwal, W Ye, J Xiong, D Kotovenko, R Ranjan, V Chandra, ... European Conference on Computer Vision, 19-37, 2025 | 15 | 2025 |
| Cross-image-attention for conditional embeddings in deep metric learning D Kotovenko, P Ma, T Milbich, B Ommer Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2023 | 8 | 2023 |
| Content and Style Disentanglement for Artistic Style Transfer. In 2019 IEEE D Kotovenko, A Sanakoyeu, S Lang, B Ommer CVF International Conference on Computer Vision, ICCV, 4421-4430, 2019 | 8 | 2019 |
| WaSt-3D: Wasserstein-2 Distance for Scene-to-Scene Stylization on 3D Gaussians D Kotovenko, O Grebenkova, N Sarafianos, A Paliwal, P Ma, ... European Conference on Computer Vision, 298-314, 2025 | | 2025 |
| Attend to Context for Refining Embeddings in Deep Metric Learning D Kotovenko, P Ma, M Fischer, B Ommer | | |
| Cross-Image-Attention for Conditional Embeddings in Deep Metric Learning–Supplementary Material– D Kotovenko, P Ma, T Milbich, B Ommer | | |
| Bidirectional global to local attention for deep metric learning. D Kotovenko, P Ma, T Milbich, B Ommer | | |
Björn OmmerProfessor, Computer Vision & Learning Group (CompVis), University of MunichVerified email at uni-heidelberg.de
