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Dima Kotovenko
Dima Kotovenko
Другие именаDmytro Kotovenko
Ludwig Maximilian University of Munich
Подтвержден адрес электронной почты в домене lrz.uni-muenchen.de
Название
Процитировано
Процитировано
Год
A style-aware content loss for real-time hd style transfer
A Sanakoyeu*, D Kotovenko*, S Lang, B Ommer
proceedings of the European conference on computer vision (ECCV), 698-714, 2018
2702018
Content and style disentanglement for artistic style transfer
D Kotovenko, A Sanakoyeu, S Lang, B Ommer
Proceedings of the IEEE/CVF international conference on computer vision …, 2019
1822019
A content transformation block for image style transfer
D Kotovenko, A Sanakoyeu, P Ma, S Lang, B Ommer
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2019
1002019
Rethinking style transfer: From pixels to parameterized brushstrokes
D Kotovenko*, M Wright*, A Heimbrecht, B Ommer
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2021
782021
Depthfm: Fast monocular depth estimation with flow matching
M Gui, JS Fischer, U Prestel, P Ma, D Kotovenko, O Grebenkova, ...
arXiv preprint arXiv:2403.13788, 2024
232024
Coherentgs: Sparse novel view synthesis with coherent 3d gaussians
A Paliwal, W Ye, J Xiong, D Kotovenko, R Ranjan, V Chandra, ...
European Conference on Computer Vision, 19-37, 2025
172025
Cross-image-attention for conditional embeddings in deep metric learning
D Kotovenko, P Ma, T Milbich, B Ommer
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2023
82023
Content and Style Disentanglement for Artistic Style Transfer. In 2019 IEEE
D Kotovenko, A Sanakoyeu, S Lang, B Ommer
CVF International Conference on Computer Vision, ICCV, 4421-4430, 2019
82019
Wast-3d: Wasserstein-2 distance for scene-to-scene stylization on 3d gaussians
D Kotovenko, O Grebenkova, N Sarafianos, A Paliwal, P Ma, ...
European Conference on Computer Vision, 298-314, 2025
12025
Does VLM Classification Benefit from LLM Description Semantics?
P Ma, L Rietdorf, D Kotovenko, VT Hu, B Ommer
arXiv preprint arXiv:2412.11917, 2024
2024
Attend to Context for Refining Embeddings in Deep Metric Learning
D Kotovenko, P Ma, M Fischer, B Ommer
Cross-Image-Attention for Conditional Embeddings in Deep Metric Learning–Supplementary Material–
D Kotovenko, P Ma, T Milbich, B Ommer
Bidirectional global to local attention for deep metric learning.
D Kotovenko, P Ma, T Milbich, B Ommer
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Статьи 1–13