| Few-shot font generation with localized style representations and factorization S Park, S Chun, J Cha, B Lee, H Shim AAAI Conference on Artificial Intelligence, 2021 | 85 | 2021 |
| Face generation for low-shot learning using generative adversarial networks J Choe, S Park, K Kim, J Hyun Park, D Kim, H Shim Proceedings of the IEEE international conference on computer vision …, 2017 | 82 | 2017 |
| Multiple Heads are Better than One: Few-shot Font Generation with Multiple Localized Experts S Park, S Chun, J Cha, B Lee, H Shim International Conference on Computer Vision (ICCV), 2021 | 74 | 2021 |
| Eccv caption: Correcting false negatives by collecting machine-and-human-verified image-caption associations for ms-coco S Chun, W Kim, S Park, M Chang, SJ Oh European Conference on Computer Vision, 1-19, 2022 | 37 | 2022 |
| Semantic-aware neural style transfer JH Park, S Park, H Shim Image and Vision Computing 87, 13-23, 2019 | 17 | 2019 |
| Seit: Storage-efficient vision training with tokens using 1% of pixel storage S Park, S Chun, B Heo, W Kim, S Yun Proceedings of the IEEE/CVF International Conference on Computer Vision …, 2023 | 10 | 2023 |
| Rotary position embedding for vision transformer B Heo, S Park, D Han, S Yun arXiv preprint arXiv:2403.13298, 2024 | 8 | 2024 |
| Styleaugment: Learning texture de-biased representations by style augmentation without pre-defined textures S Chun, S Park arXiv preprint arXiv:2108.10549, 2021 | 7 | 2021 |
| Few-shot font generation with weakly supervised localized representations S Park, S Chun, J Cha, B Lee, H Shim IEEE transactions on pattern analysis and machine intelligence 46 (3), 1479-1495, 2022 | 6 | 2022 |
| Similarity of Neural Architectures Based on Input Gradient Transferability J Hwang, D Han, B Heo, S Park, S Chun, JS Lee arXiv preprint arXiv:2210.11407, 2022 | 3 | 2022 |
| SeiT++: Masked Token Modeling Improves Storage-efficient Training M Lee, S Park, B Heo, D Han, H Shim arXiv preprint arXiv:2312.10105, 2023 | | 2023 |
Hyunjung ShimAssociate Professor, KAISTVerified email at kaist.ac.kr
