ian w boyd

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Valentin CraciunNatl. Inst. for Laser, Plasma and Radiation PhysicsVerified email at inflpr.ro
pk hurleyTyndall National Institute, University College CorkVerified email at tyndall.ie
Barry O'SullivanIMECVerified email at imec.be
John i b Wilsonheriot-watt universityVerified email at hw.ac.uk
Carmen JiménezLMGP -CNRSVerified email at grenoble-inp.fr
Philippe BergonzoVP Seki Diamond Systems & Vis. Prof. UCL London UKVerified email at sekidiamond.com
Tsutomu IwayamaExecutive Vice-President | Professor, Aichi University of Education / 愛知教育大学Verified email at auecc.aichi-edu.ac.jp
Martin ElliottReader, Cardiff UniversityVerified email at cf.ac.uk
Colin HumphreysQueen Mary University of LondonVerified email at qmul.ac.uk
James Thomas GriffithsResearch associate, University of CambridgeVerified email at cam.ac.uk
Rachel OliverProfessor of Materials Science, Cambridge UniversityVerified email at cam.ac.uk
Richard JackmanUniversity College LondonVerified email at ucl.ac.uk
Tony KenyonProfessor of Nanoelectronic & Nanophotonic Materials, UCLVerified email at ee.ucl.ac.uk
Catherine DubourdieuHelmholtz Zentrum BerlinVerified email at helmholtz-berlin.de
Mircea ModreanuPrincipal Investigator, Tyndall National Institute, University College CorkVerified email at tyndall.ie
Kyriacos KalliPhotonics and Optical Sensors Research Laboratory (PhOSLab), Cyprus University of TechnologyVerified email at cut.ac.cy
David E WilliamsEmeritus Professor of Chemistry, University of AUcklandVerified email at Auckland.ac.nz
Pascal AndreazzaUniversité d'Orléans, ICMN, FranceVerified email at univ-orleans.fr
Glenn C. TyrrellVisiting Professor, Electronic and Electrical Engineering, University College London

ian w boyd

Brunel University

Verified email at brunel.ac.uk - Homepage

Nanotechnology materials thin films lasers silicon


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Characteristics of high quality ZnO thin films deposited by pulsed laser deposition V Craciun, J Elders, JGE Gardeniers, IW Boyd Applied physics letters 65 (23), 2963-2965, 1994	403	1994
Laser processing of thin films and microstructures: oxidation, deposition and etching of insulators IW Boyd Springer Science & Business Media, 2013	392	2013
Nanocrystalline TiO2 films studied by optical, XRD and FTIR spectroscopy JY Zhang, IW Boyd, BJ O'sullivan, PK Hurley, PV Kelly, JP Senateur Journal of Non-Crystalline Solids 303 (1), 134-138, 2002	243	2002
A study of thin silicon dioxide films using infrared absorption techniques IW Boyd, JIB Wilson Journal of Applied Physics 53 (6), 4166-4172, 1982	238	1982
Simultaneous measurement of the two-photon coefficient and free-carrier cross section above the bandgap of crystalline silicon T Boggess, K Bohnert, K Mansour, S Moss, I Boyd, A Smirl IEEE journal of quantum electronics 22 (2), 360-368, 1986	220	1986
Optical limiting in GaAs T Boggess, A Smirl, S Moss, I Boyd, E Van Stryland IEEE journal of quantum electronics 21 (5), 488-494, 1985	213	1985
High-intensity sources of incoherent UV and VUV excimer radiation for low-temperature materials processing U Kogelschatz, H Esrom, JY Zhang, IW Boyd Applied Surface Science 168 (1-4), 29-36, 2000	171	2000
Efficient excimer ultraviolet sources from a dielectric barrier discharge in rare‐gas/halogen mixtures JY Zhang, IW Boyd Journal of Applied Physics 80 (2), 633-638, 1996	167	1996
Pulsed-laser deposited ZnO for device applications SL King, JGE Gardeniers, IW Boyd Applied surface science 96, 811-818, 1996	154	1996
New large area ultraviolet lamp sources and their applications IW Boyd, JY Zhang Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1997	135	1997
Silicon‐silicon dioxide interface: An infrared study IW Boyd, JIB Wilson Journal of applied physics 62 (8), 3195-3200, 1987	118	1987
Mechanism of photoluminescence of Si nanocrystals in SiO2 fabricated by ion implantation: the role of interactions of nanocrystals and oxygen T Shimizu-Iwayama, DE Hole, IW Boyd Journal of Physics: Condensed Matter 11 (34), 6595, 1999	117	1999
Nonlinear-optical energy regulation by nonlinear refraction and absorption in silicon TF Boggess, SC Moss, IW Boyd, AL Smirl Optics letters 9 (7), 291-293, 1984	117	1984
Growth of ZnO thin films on GaAs by pulsed laser deposition V Craciun, J Elders, JGE Gardeniers, J Geretovsky, IW Boyd Thin solid films 259 (1), 1-4, 1995	113	1995
Effects of laser wavelength and fluence on the growth of ZnO thin films by pulsed laser deposition V Craciun, S Amirhaghi, D Craciun, J Elders, JGE Gardeniers, IW Boyd Applied surface science 86 (1-4), 99-106, 1995	113	1995
Low temperature growth of highly transparent c-axis oriented ZnO thin films by pulsed laser deposition S Amirhaghi, V Craciun, D Craciun, J Elders, IW Boyd Microelectronic engineering 25 (2-4), 321-326, 1994	112	1994
Photochemical processing of electronic materials IW Boyd, RB Jackman (No Title), 1992	96	1992
Deconvolution of the infrared absorption peak of the vibrational stretching mode of silicon dioxide: Evidence for structural order? IW Boyd Applied physics letters 51 (6), 418-420, 1987	93	1987
FTIR and XPS investigation of Er-doped SiO2–TiO2 films Q Fang, M Meier, JJ Yu, ZM Wang, JY Zhang, JX Wu, A Kenyon, ... Materials Science and Engineering: B 105 (1-3), 209-213, 2003	89	2003
UV curing of optical fibre coatings using excimer lamps JY Zhang, G Windall, IW Boyd Applied surface science 186 (1-4), 568-572, 2002	86	2002

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