Elmet Orasson
Elmet Orasson
Researcher, TUT
Verified email at
Cited by
Cited by
Turbo Tester–diagnostic package for research and training
M Aarna, E Ivask, A Jutman, E Orasson, J Raik, R Ubar, V Vislogubov, ...
Радиоэлектроника и информатика, 69-73, 2003
Hybrid BIST optimization using reseeding and test set compaction
G Jervan, E Orasson, H Kruus, R Ubar
Microprocessors and Microsystems 32 (5-6), 254-262, 2008
Fast test cost calculation for hybrid BIST in digital systems
E Orasson, R Raidma, R Ubar, G Jervan, Z Peng
Proceedings Euromicro Symposium on Digital Systems Design, 318-325, 2001
Internet-based software for teaching test of digital circuits
R Ubar, E Orasson, HD Wuttke
2002 23rd International Conference on Microelectronics. Proceedings (Cat. No …, 2002
E-Learning tool and Exercises for Teaching Digital Test
R Ubar, E Orasson
Proc. of 2nd IEEE Conf. on Signals, Systems, Decision and Information …, 2003
HyFBIST: Hybrid functional built-in self-test in microprogrammed data-paths of digital systems
R Ubar, N Mazurova, J Smahtina, E Orasson, J Raik
Int. Conference MIXDES, Szczecin, 497-502, 2004
Fault Collapsing in Digital Circuits Using Fast Fault Dominance and Equivalence Analysis with SSBDDs
R Ubar, L Jürimägi, E Orasson, J Raik
VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5 …, 2016
Functional built-in self-test for processor cores in SoC
R Ubar, V Indus, O Kalmend, T Evartson, E Orasson
NORCHIP 2012, 1-4, 2012
Double phase fault collapsing with linear complexity in digital circuits
R Ubar, L Jürimägi, E Orasson, G Josifovska, SA Oyeniran
2015 Euromicro Conference on Digital System Design, 700-705, 2015
Optimization of the store-and-generate based built-in self-test
R Ubar, G Jervan, H Kruus, E Orasson, I Aleksejev
2006 International Biennial Baltic Electronics Conference, 1-4, 2006
Scalable algorithm for structural fault collapsing in digital circuits
R Ubar, L Jürimägi, E Orasson, J Raik
2015 IFIP/IEEE International Conference on Very Large Scale Integration …, 2015
Learning Digital Test and Diagnostics via Internet
R Ubar, A Jutman, M Kruus, E Orasson, S Devadze, HD Wuttke
International Journal of Computing & Information Sciences 4 (2), 86-96, 2006
Investigating Defects in Digital Circuits by Boolean Differential Equations
H Kruus, E Orasson, T Robal, R Ubar
The 4th International Conference “Distance Learning–Educational Sphere of …, 2004
A benchmark suite for evaluating the efficiency of test tools
H Kruus, R Ubar, P Ellervee, M Gorev, V Pesonen, S Devadze, E Orasson, ...
2012 13th Biennial Baltic Electronics Conference, 85-88, 2012
Hybrid built-in self-test
E Orasson
Methods and Tools for Analysis and Optimization of BIST, 2007
Teaching advanced test issues in digital electronics
R Ubar, E Orasson, J Raik, HD Wuttke
2005 6th International Conference on Information Technology Based Higher …, 2005
E-Learning Tools for Digital Test
S Devadze, R Gorjachev, A Jutman, E Orasson, V Rosin, R Ubar
Proc. of Distance Learning–Educational Environment of the XXI Century Conf …, 2003
Interactive Teaching Software “Introduction To Digital Test “
R Ubar, HD Wuttke, E Orasson
Proceedings of the 45. International Scientific Conference, TU Ilmenau 4 (6 …, 2000
A tool set for teaching design-for-testability of digital circuits
S Kostin, E Orasson, R Ubar
2016 11th European Workshop on Microelectronics Education (EWME), 1-6, 2016
E-Learning Environment for WEB-Based Study of Testing
R Ubar, A Jutman, J Raik, S Devadze, M Jenihhin, I Aleksejev, ...
Proc. of the 8th European Workshop on Microelectronics Education-EWME 2010 …, 2010
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