| Turbo Tester–diagnostic package for research and training M Aarna, E Ivask, A Jutman, E Orasson, J Raik, R Ubar, V Vislogubov, ... Радиоэлектроника и информатика, 69-73, 2003 | 32 | 2003 |
| Turbo Tester–diagnostic package for research and training M Aarna, E Ivask, A Jutman, E Orasson, J Raik, R Ubar, V Vislogubov, ... Радиоэлектроника и информатика, 69-73, 2003 | 32 | 2003 |
| Hybrid BIST optimization using reseeding and test set compaction G Jervan, E Orasson, H Kruus, R Ubar Microprocessors and Microsystems 32 (5-6), 254-262, 2008 | 22 | 2008 |
| Fast test cost calculation for hybrid BIST in digital systems E Orasson, R Raidma, R Ubar, G Jervan, Z Peng Proceedings Euromicro Symposium on Digital Systems Design, 318-325, 2001 | 19 | 2001 |
| Internet-based software for teaching test of digital circuits R Ubar, E Orasson, HD Wuttke 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No …, 2002 | 16 | 2002 |
| E-Learning tool and Exercises for Teaching Digital Test R Ubar, E Orasson Proc. of 2nd IEEE Conf. on Signals, Systems, Decision and Information …, 2003 | 14 | 2003 |
| HyFBIST: Hybrid functional built-in self-test in microprogrammed data-paths of digital systems R Ubar, N Mazurova, J Smahtina, E Orasson, J Raik Int. Conference MIXDES, Szczecin, 497-502, 2004 | 9 | 2004 |
| Fault Collapsing in Digital Circuits Using Fast Fault Dominance and Equivalence Analysis with SSBDDs R Ubar, L Jürimägi, E Orasson, J Raik VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5 …, 2016 | 6 | 2016 |
| Functional built-in self-test for processor cores in SoC R Ubar, V Indus, O Kalmend, T Evartson, E Orasson NORCHIP 2012, 1-4, 2012 | 6 | 2012 |
| Double phase fault collapsing with linear complexity in digital circuits R Ubar, L Jürimägi, E Orasson, G Josifovska, SA Oyeniran 2015 Euromicro Conference on Digital System Design, 700-705, 2015 | 5 | 2015 |
| Optimization of the store-and-generate based built-in self-test R Ubar, G Jervan, H Kruus, E Orasson, I Aleksejev 2006 International Biennial Baltic Electronics Conference, 1-4, 2006 | 5 | 2006 |
| Scalable algorithm for structural fault collapsing in digital circuits R Ubar, L Jürimägi, E Orasson, J Raik 2015 IFIP/IEEE International Conference on Very Large Scale Integration …, 2015 | 4 | 2015 |
| Learning Digital Test and Diagnostics via Internet R Ubar, A Jutman, M Kruus, E Orasson, S Devadze, HD Wuttke International Journal of Computing & Information Sciences 4 (2), 86-96, 2006 | 4 | 2006 |
| Investigating Defects in Digital Circuits by Boolean Differential Equations H Kruus, E Orasson, T Robal, R Ubar The 4th International Conference “Distance Learning–Educational Sphere of …, 2004 | 4 | 2004 |
| A benchmark suite for evaluating the efficiency of test tools H Kruus, R Ubar, P Ellervee, M Gorev, V Pesonen, S Devadze, E Orasson, ... 2012 13th Biennial Baltic Electronics Conference, 85-88, 2012 | 3 | 2012 |
| Hybrid built-in self-test E Orasson Methods and Tools for Analysis and Optimization of BIST, 2007 | 3 | 2007 |
| Teaching advanced test issues in digital electronics R Ubar, E Orasson, J Raik, HD Wuttke 2005 6th International Conference on Information Technology Based Higher …, 2005 | 3 | 2005 |
| E-Learning Tools for Digital Test S Devadze, R Gorjachev, A Jutman, E Orasson, V Rosin, R Ubar Proc. of Distance Learning–Educational Environment of the XXI Century Conf …, 2003 | 3 | 2003 |
| Interactive Teaching Software “Introduction To Digital Test “ R Ubar, HD Wuttke, E Orasson Proceedings of the 45. International Scientific Conference, TU Ilmenau 4 (6 …, 2000 | 3 | 2000 |
| A tool set for teaching design-for-testability of digital circuits S Kostin, E Orasson, R Ubar 2016 11th European Workshop on Microelectronics Education (EWME), 1-6, 2016 | 2 | 2016 |
