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Jason Verley
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Xyce Parallel Electronic Simulator: users' guide.
ER Keiter, T Mei, TV Russo, EL Rankin, RL Schiek, HK Thornquist, ...
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA …, 2012
51*2012
Overcoming limitations in semiconductor alloy design
A Mascarenhas, Y Zhang, J Verley, MJ Seong
Superlattices and microstructures 29 (6), 395-404, 2001
442001
Xyce™ Parallel Electronic Simulator Users’ Guide, Version 7.8
ER Keiter, R Schiek, HK Thornquist, T Mei, JC Verley, JD Schickling, ...
Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2023
332023
Xyce Parallel Electronic Simulator: reference guide.
ER Keiter, T Mei, TV Russo, EL Rankin, RL Schiek, HK Thornquist, ...
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA …, 2012
302012
Evolution of electronic states in GaAs 1− x N x probed by resonant Raman spectroscopy
A Mascarenhas, MJ Seong, S Yoon, JC Verley, JF Geisz, MC Hanna
Physical Review B 68 (23), 233201, 2003
242003
Effective electron mass and plasma filter characterization of n-type InGaAs and InAsP
WK Metzger, MW Wanlass, LM Gedvilas, JC Verley, JJ Carapella, ...
Journal of applied physics 92 (7), 3524-3529, 2002
212002
Emissivity measurements of 3D photonic crystals at high temperatures
TS Luk, T Mclellan, G Subramania, JC Verley, I El-Kady
Photonics and Nanostructures-Fundamentals and Applications 6 (1), 81-86, 2008
132008
Xyce™ Parallel Electronic Simulator Reference Guide (V. 7.6)
ER Keiter, TV Russo, RL Schiek, HK Thornquist, T Mei, JC Verley, ...
Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2022
122022
Silicon nanocrystal growth in the long diffusion length regime using high density plasma chemical vapour deposited silicon rich oxides
MS Carroll, L Brewer, JC Verley, J Banks, JJ Sheng, W Pan, R Dunn
Nanotechnology 18 (31), 315707, 2007
102007
Roughening transition in nanoporous hydrogenated amorphous germanium: Roughness correlation to film stress
MS Carroll, JC Verley, JJ Sheng, J Banks
Journal of applied physics 101 (6), 2007
92007
A parallel detecting, spectroscopic ellipsometer for intelligent process control of continuously deposited CIGS films
LJ Simpson, BS Joshi, LA Gonzales, J Verley, TE Furtak
MRS Online Proceedings Library 616, 9-14, 2000
92000
A new time-dependent analytic model for radiation-induced photocurrent in finite 1D epitaxial diodes.
JC Verley, CL Axness, CE Hembree, ER Keiter, B Kerr
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA …, 2012
82012
Xyce: Open Source Simulation for Large-Scale Circuits.
J Verley, ER Keiter, HK Thornquist
Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2018
72018
Variable-angle directional emissometer for moderate-temperature emissivity measurements
AR Ellis, HM Graham, MB Sinclair, JC Verley
Reflection, Scattering, and Diffraction from Surfaces 7065, 47-55, 2008
72008
Tilted logpile photonic crystals using the LIGA technique
JD Williams, C Arrington, WC Sweatt, DW Peters, I El-Kady, AR Ellis, ...
Novel Optical Systems Design and Optimization IX 6289, 75-81, 2006
72006
Argon–germane in situ plasma clean for reduced temperature Ge on Si epitaxy by high density plasma chemical vapor deposition
EA Douglas, JJ Sheng, JC Verley, MS Carroll
Journal of Vacuum Science & Technology B 33 (4), 2015
62015
Fabrication and characterization of large-area 3D photonic crystals
FB McCormick, JG Fleming, S Mani, MR Tuck, JD Williams, CL Arrington, ...
2006 IEEE Aerospace Conference, 8 pp., 2006
62006
A new time-dependent analytic compact model for radiation-induced photocurrent in epitaxial structures
JC Verley, ER Keiter, CE Hembree, CL Axness, B Kerr
2013 International Conference on Simulation of Semiconductor Processes and …, 2013
52013
Low-temperature hetero-epitaxial growth of Ge on Si by high density plasma chemical vapor deposition
M Carroll, J Sheng, JC Verley
MRS Online Proceedings Library (OPL) 934, 0934-I09-02, 2006
32006
Use of electrochromic materials in adaptive optics
DR Kammler, WG Yelton, WC Sweatt, JC Verley
Target-in-the-Loop: Atmospheric Tracking, Imaging, and Compensation II 5895 …, 2005
32005
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