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Co-authors
- Vincent C PaquitSection Head - Secure & Digital Manufacturing @ Oak Ridge National LaboratoryVerified email at ornl.gov
- Ryan DehoffOak Ridge National LaboratoryVerified email at ornl.gov
- Luke ScimeOak Ridge National LaboratoryVerified email at ornl.gov
- James HaleyOak Ridge National LaboratoryVerified email at ornl.gov
- Alex PlotkowskiOak Ridge National LaboratoryVerified email at ornl.gov
- Michael SprayberryOak Ridge National LaboratoryVerified email at ornl.gov
- Michael KirkaOak Ridge National LaboratoryVerified email at ornl.gov
- Benjamin StumpOak Ridge National LaboratoryVerified email at ornl.gov
- Amir Koushyar ZiabariSenior R&D Scientist, ESTD/EEID/MSA Group, Oak Ridge National LaboratoryVerified email at ornl.gov
- Chad A. SteedOak Ridge National LaboratoryVerified email at acm.org
- Derek RoseR&D Associate, Oak Ridge National LaboratoryVerified email at ornl.gov
- Zackary K SnowOak Ridge National LabsVerified email at ornl.gov
- Sudarsanam BabuUniversity of Tennessee, Knoxville & Oak Ridge National Laboratory, Oak RidgeVerified email at utk.edu
- Vladimir OrlyanchikOak Ridge National LaboratoryVerified email at ornl.gov
- Gerald L. KnappOak Ridge National LaboratoryVerified email at ornl.gov