| A suite of IEEE 1687 benchmark networks A Tšertov, A Jutman, S Devadze, MS Reorda, E Larsson, FG Zadegan, ... 2016 IEEE International Test Conference (ITC), 1-10, 2016 | 53 | 2016 |
| High-level modeling and testing of multiple control faults in digital systems A Jasnetski, SA Oyeniran, A Tsertov, M Schölzel, R Ubar 2016 IEEE 19th International Symposium on Design and Diagnostics of …, 2016 | 15 | 2016 |
| Calculation of LFSR seed and polynomial pair for BIST applications A Jutman, A Tsertov, R Ubar 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and …, 2008 | 15 | 2008 |
| Post-silicon validation of IEEE 1687 reconfigurable scan networks A Damljanovic, A Jutman, G Squillero, A Tsertov 2019 IEEE European Test Symposium (ETS), 1-6, 2019 | 11 | 2019 |
| Software-based self-test generation for microprocessors with high-level decision diagrams R Ubar, A Tsertov, A Jasnetski, M Brik 2014 15th Latin American Test Workshop-LATW, 1-6, 2014 | 11 | 2014 |
| On automatic software-based self-test program generation based on high-level decision diagrams A Jasnetski, R Ubar, A Tsertov 2016 17th Latin-American Test Symposium (LATS), 177-177, 2016 | 10 | 2016 |
| Software-based self-test generation for microprocessors with high-level decision diagrams A Jasnetski, R Ubar, A Tsertov, M Brik Proceedings of the Estonian Academy of Sciences 63 (1), 48, 2014 | 9 | 2014 |
| IEEE 1687 compliant ecosystem for embedded instrumentation access and in-field health monitoring A Tsertov, A Jutman, K Shibin, S Devadze 2018 IEEE AUTOTESTCON, 1-9, 2018 | 7 | 2018 |
| FPGA-controlled PCBA power-on self-test using processor's debug features B Du, E Sánchez, MS Reorda, JP Acle, A Tsertov 2016 IEEE 19th International Symposium on Design and Diagnostics of …, 2016 | 7 | 2016 |
| Microprocessor-based system test using debug interface S Devadze, A Jutman, A Tsertov, M Instenberg, R Ubar 2008 NORCHIP, 98-101, 2008 | 7 | 2008 |
| Automated software-based self-test generation for microprocessors A Jasnetski, R Ubar, A Tsertov 2017 MIXDES-24th International Conference" Mixed Design of Integrated …, 2017 | 6 | 2017 |
| New fault models and self-test generation for microprocessors using high-level decision diagrams A Jasnetski, J Raik, A Tsertov, R Ubar 2015 IEEE 18th International Symposium on Design and Diagnostics of …, 2015 | 6 | 2015 |
| Soc and board modeling for processor-centric board testing A Tsertov, R Ubar, A Jutman, S Devadze 2011 14th Euromicro Conference on Digital System Design, 575-582, 2011 | 6 | 2011 |
| Microprocessor modeling for board level test access automation S Devadze, A Jutman, A Tsertov, R Ubar Proc. of 10th IEEE Workshop on RTL and High Level Testing, 154-159, 2009 | 5 | 2009 |
| Teaching digital test with BIST analyzer A Jutman, A Tsertov, A Tsepurov, I Aleksejev, R Ubar, HD Wuttke 2008 19th EAEEIE Annual Conference, 123-128, 2008 | 4 | 2008 |
| BIST analyzer: A training platform for SoC testing A Jutman, A Tsertov, A Tsepurov, I Aleksejev, R Ubar, HD Wuttke 2007 37th Annual Frontiers In Education Conference-Global Engineering …, 2007 | 4 | 2007 |
| Simulation-based Equivalence Checking between IEEE 1687 ICL and RTL A Damljanovic, A Jutman, M Portolan, E Sanchez, G Squillero, A Tsertov 2019 IEEE International Test Conference (ITC), 1-8, 2019 | 3 | 2019 |
| High-level test data generation for software-based self-test in microprocessors AS Oyeniran, A Jasnetski, A Tsertov, R Ubar 2017 6th Mediterranean Conference on Embedded Computing (MECO), 1-6, 2017 | 3 | 2017 |
| Automatic soc level test path synthesis based on partial functional models A Tsertov, R Ubar, A Jutman, S Devadze 2011 Asian Test Symposium, 532-538, 2011 | 3 | 2011 |
| VLSI-SoC: System-on-Chip in the Nanoscale Era–Design, Verification and Reliability T Hollstein, J Raik, S Kostin, A Tšertov, I O'Connor, R Reis Springer International Publishing, 2017 | 2 | 2017 |
