Подписаться
Jeffrey A Ivie
Jeffrey A Ivie
Подтвержден адрес электронной почты в домене sandia.gov
Название
Процитировано
Процитировано
Год
Water Oxidation by Mononuclear Ruthenium Complexes with TPA-Based Ligands
B Radaram, JA Ivie, WM Singh, RM Grudzien, JH Reibenspies, ...
Inorganic Chemistry 50 (21), 10564-10571, 2011
822011
Uncovering hierarchical data structure in single molecule transport
BH Wu, JA Ivie, TK Johnson, OLA Monti
The Journal of Chemical Physics 146 (9), 092321, 2017
192017
Unsupervised Segmentation-Based Machine Learning as an Advanced Analysis Tool for Single Molecule Break Junction Data (vol 124, pg 18302, 2020)
ND Bamberger, JA Ivie, KN Parida, DV McGrath, OLA Monti
JOURNAL OF PHYSICAL CHEMISTRY C 124 (43), 24029-24031, 2020
13*2020
Correlated Energy-Level Alignment Effects Determine Substituent-Tuned Single-Molecule Conductance
JA Ivie, ND Bamberger, KN Parida, S Shepard, D Dyer, A Saraiva-Souza, ...
ACS Applied Materials & Interfaces 13 (3), 4267-4277, 2021
112021
A Model for Atomic Precision p-Type Doping with Diborane on Si (100)-2× 1
Q Campbell, JA Ivie, E Bussmann, SW Schmucker, AD Baczewski, ...
The Journal of Physical Chemistry C 125 (1), 481-488, 2021
112021
Fast sensitive amplifier for two-probe conductance measurements in single molecule break junctions
TK Johnson, JA Ivie, J Jaruvang, OLA Monti
Review of Scientific Instruments 88 (3), 033904, 2017
102017
Impact of Incorporation Kinetics on Device Fabrication with Atomic Precision
JA Ivie, Q Campbell, JC Koepke, MI Brickson, PA Schultz, RP Muller, ...
Physical Review Applied 16 (5), 054037, 2021
7*2021
Photothermal alternative to device fabrication using atomic precision advanced manufacturing techniques
AM Katzenmeyer, S Dmitrovic, AD Baczewski, E Bussmann, TM Lu, ...
Novel Patterning Technologies for Semiconductors, MEMS/NEMS and MOEMS 2020 …, 2020
62020
Al-alkyls as acceptor dopant precursors for atomic-scale devices
JHG Owen, Q Campbell, R Santini, JA Ivie, AD Baczewski, ...
Journal of Physics: Condensed Matter 33 (46), 464001, 2021
52021
Modeling assisted room temperature operation of atomic precision advanced manufacturing devices
X Gao, LA Tracy, EM Anderson, DAM Campbell, JA Ivie, TM Lu, ...
2020 International Conference on Simulation of Semiconductor Processes and …, 2020
32020
Quantum Transport in Si: P δ-Layer Wires
JP Mendez, D Mamaluy, X Gao, EM Anderson, DAM Campbell, JA Ivie, ...
2020 International Conference on Simulation of Semiconductor Processes and …, 2020
32020
Path Towards a Vertical TFET Enabled by Atomic Precision Advanced Manufacturing
TM Lu, X Gao, EM Anderson, JP Mendez, DAM Campbell, JA Ivie, ...
2021 Silicon Nanoelectronics Workshop (SNW), 1-2, 2021
22021
Accelerated Lifetime Testing and Analysis of Delta-doped Silicon Test Structures
C Halsey, J Depoy, MC De Anna, DR Ward, EM Anderson, ...
IEEE Transactions on Device and Materials Reliability, 2022
2022
Modeling and Assessment of Atomic Precision Advanced Manufacturing (APAM) Enabled Vertical Tunneling Field Effect Transistor
X Gao, JP Mendez, TM Lu, EM Anderson, DAM Campbell, JA Ivie, ...
2021 International Conference on Simulation of Semiconductor Processes and …, 2021
2021
Accessing Atomic-scale Phosphorus Dopant Distribution in Precise Silicon Devices by Advanced STEM Imaging and Spectroscopy
P Lu, E Anderson, S Schmucker, F Pena, E Frederick, J Ivie, E Bussmann, ...
Microscopy and Microanalysis 26 (S2), 1516-1517, 2020
2020
В данный момент система не может выполнить эту операцию. Повторите попытку позднее.
Статьи 1–15