| An Empirical Comparison of Model Validation Techniques for Defect Prediction Models C Tantithamthavorn, S McIntosh, AE Hassan, K Matsumoto IEEE Transactions on Software Engineering (TSE) 43 (1), 1-18, 2017 | 510 | 2017 |
| Automated Parameter Optimization of Classification Techniques for Defect Prediction Models C Tantithamthavorn, S McIntosh, AE Hassan, K Matsumoto In Proceedings of The 38th International Conference on Software Engineering …, 2016 | 352 | 2016 |
| The Impact of Automated Parameter Optimization on Defect Prediction Models C Tantithamthavorn, S McIntosh, AE Hassan, K Matsumoto IEEE Transactions on Software Engineering 45 (7), 683-711, 2018 | 324 | 2018 |
| Who Should Review My Code? A File Location-Based Code-Reviewer Recommendation Approach for Modern Code Review P Thongtanunam, C Tantithamthavorn, RG Kula, N Yoshida, H Iida, ... In Proceedings of the 22nd IEEE International Conference on Software …, 2015 | 275 | 2015 |
| The Impact of Class Rebalancing Techniques on the Performance and Interpretation of Defect Prediction Models C Tantithamthavorn, AE Hassan, K Matsumoto IEEE Transactions on Software Engineering, 2020 | 259 | 2020 |
| The Impact of Mislabelling on the Performance and Interpretation of Defect Prediction Models C Tantithamthavorn, S McIntosh, AE Hassan, A Ihara, K Matsumoto In Proceedings of The 37th International Conference on Software Engineering …, 2015 | 163 | 2015 |
| An Experience Report on Defect Modelling in Practice: Pitfalls and Challenges C Tantithamthavorn, AE Hassan In Proceedings of the International Conference on Software Engineering (ICSE …, 2018 | 147 | 2018 |
| An empirical study of model-agnostic techniques for defect prediction models J Jiarpakdee, CK Tantithamthavorn, HK Dam, J Grundy IEEE Transactions on Software Engineering 48 (1), 166-185, 2020 | 109 | 2020 |
| The Impact of Correlated Metrics on the Interpretation of Defect Models J Jiarpakdee, C Tantithamthavorn, AE Hassan IEEE Transactions on Software Engineering, 2019 | 99* | 2019 |
| Mining Software Defects: Should We Consider Affected Releases? S Yatish, J Jiarpakdee, P Thongtanunam, C Tantithamthavorn 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE …, 2019 | 96 | 2019 |
| Comments on "Researcher Bias: The Use of Machine Learning in Software Defect Prediction" C Tantithamthavorn, S McIntosh, AE Hassan, K Matsumoto IEEE Transactions on Software Engineering (TSE) 42 (11), 1092-1094, 2016 | 82 | 2016 |
| Studying the dialogue between users and developers of free apps in the google play store S Hassan, C Tantithamthavorn, CP Bezemer, AE Hassan Empirical Software Engineering 23, 1275-1312, 2018 | 79 | 2018 |
| JITLine: A Simpler, Better, Faster, Finer-grained Just-In-Time Defect Prediction C Pornprasit, C Tantithamthavorn In Proceedings of the International Conference on Mining Software …, 2021 | 72 | 2021 |
| Predicting Defective Lines Using a Model-Agnostic Technique S Wattanakriengkrai, P Thongtanunam, C Tantithamthavorn, H Hata, ... IEEE Transactions on Software Engineering, 2020 | 68 | 2020 |
| AutoSpearman: Automatically mitigating correlated software metrics for interpreting defect models J Jiarpakdee, C Tantithamthavorn, C Treude 2018 IEEE International Conference on Software Maintenance and Evolution …, 2018 | 57* | 2018 |
| LineVul: A Transformer-based Line-Level Vulnerability Prediction M Fu, C Tantithamthavorn In Proceedings of the International Conference on Mining Software …, 2022 | 56 | 2022 |
| Using Co-Change Histories to Improve Bug Localization Performance C Tantithamthavorn, A Ihara, K Matsumoto In Proceedings of the 14th IEEE/ACIS International Conference on Software …, 2013 | 56 | 2013 |
| Deep learning for android malware defenses: a systematic literature review Y Liu, C Tantithamthavorn, L Li, Y Liu ACM Computing Surveys 55 (8), 1-36, 2022 | 54 | 2022 |
| Practitioners' Perceptions of the Goals and Visual Explanations of Defect Prediction Models J Jiarpakdee, C Tantithamthavorn, J Grundy In Proceedings of the International Conference on Mining Software …, 2021 | 53 | 2021 |
| The Impact of Automated Feature Selection Techniques on the Interpretation of Defect Models J Jiarpakdee, C Tantithamthavorn, C Treude Empirical Software Engineering, 1-49, 2020 | 51 | 2020 |
Kenichi MatsumotoNAISTVerified email at is.naist.jp
