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Stephen E Holland
Stephen E Holland
Подтвержден адрес электронной почты в домене lbl.gov
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Процитировано
Процитировано
Год
The dark energy camera
B Flaugher, HT Diehl, K Honscheid, TMC Abbott, O Alvarez, R Angstadt, ...
The Astronomical Journal 150 (5), 150, 2015
10772015
ATLAS technical proposal
Atlas Collaboration
CERN/LHCC/94-43, 1994
799*1994
Electrical breakdown in thin gate and tunneling oxides
IC Chen, SE Holland, C Hu
IEEE journal of Solid-state Circuits 20 (1), 333-342, 1985
6611985
The silicon vertex detector of the Collider Detector at Fermilab
D Amidei, P Azzi, N Bacchetta, MW Bailey, B Barnett, F Bedeschi, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1994
5021994
The DESI experiment part I: science, targeting, and survey design
A Aghamousa, J Aguilar, S Ahlen, S Alam, LE Allen, CA Prieto, J Annis, ...
arXiv preprint arXiv:1611.00036, 2016
4172016
Fully depleted, back-illuminated charge-coupled devices fabricated on high-resistivity silicon
SE Holland, DE Groom, NP Palaio, RJ Stover, M Wei
IEEE Transactions on Electron Devices 50 (1), 225-238, 2003
3512003
Single-Electron and Single-Photon Sensitivity with a Silicon Skipper CCD
TTY Javier Tiffenberg, Miguel Sofo-Haro, Alex Drlica-Wagner, Rouven Essig ...
Phys. Rev. Lett. 119, 131802, 2017
2622017
Substrate hole current and oxide breakdown
IC Chen, S Holland, KK Young, C Chang, C Hu
Applied physics letters 49 (11), 669-671, 1986
2451986
The DESI experiment Part I: science, targeting, and survey design
D Collaboration, A Aghamousa, J Aguilar, S Ahlen, S Alam, L Allen, ...
2202016
A quantitative physical model for time-dependent breakdown in SiO2
IC Chen, S Holland, C Hut
23rd International Reliability Physics Symposium, 24-31, 1985
1831985
Electron‐trap generation by recombination of electrons and holes in SiO2
IC Chen, S Holland, C Hu
Journal of Applied Physics 61 (9), 4544-4548, 1987
1601987
Fabrication of detectors and transistors on high-resistivity silicon
S Holland
Nucl. Instrum. Methods Phys. Res., Sect. A.;(Netherlands) 275 (3), 1989
1471989
Overview of the supernova/acceleration probe (snap)
G Aldering, CW Akerlof, R Amanullah, P Astier, E Barrelet, C Bebek, ...
Future Research Direction and Visions for Astronomy 4835, 146-157, 2002
1112002
Status of the dark energy survey camera (decam) project
BL Flaugher, TMC Abbott, R Angstadt, J Annis, ML Antonik, J Bailey, ...
Ground-based and Airborne Instrumentation for Astronomy IV 8446, 343-357, 2012
1062012
Hole trapping and breakdown in thin SiO2
IC Chen, S Holland, C Hu
IEEE electron device letters 7 (3), 164-167, 1986
1041986
On physical models for gate oxide breakdown
S Holland, IC Chen, TP Ma, C Hu
IEEE electron device letters 5 (8), 302-305, 1984
931984
Correlation Between Breakdown and Process‐Induced Positive Charge Trapping in Thin Thermal SiO2
S Holland, C Hu
Journal of the Electrochemical Society 133 (8), 1705, 1986
901986
Oxide breakdown dependence on thickness and hole current-enhanced reliability of ultra thin oxides
IC Chen, S Holland, C Hu
1986 International Electron Devices Meeting, 660-663, 1986
881986
Development of low noise, back-side illuminated silicon photodiode arrays
SE Holland, NW Wang, WW Moses
IEEE Transactions on Nuclear Science 44 (3), 443-447, 1997
861997
The CDF SVX: a silicon vertex detector for a hadron collider
WC Carithers, RP Ely, C Haber, S Holland, F Kirsten, S Kleinfelder, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1990
781990
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