| Defect pattern recognition on wafers using convolutional neural networks R Wang, N Chen Quality and Reliability Engineering International 36 (4), 1245-1257, 2020 | 38 | 2020 |
| Wafer map defect pattern recognition using rotation-invariant features R Wang, N Chen IEEE Transactions on Semiconductor Manufacturing 32 (4), 596-604, 2019 | 34 | 2019 |
| A survey of condition-based maintenance modeling of multi-component systems R Wang, N Chen 2016 IEEE International Conference on Industrial Engineering and Engineering …, 2016 | 16 | 2016 |
| Detection and recognition of mixed-type defect patterns in wafer bin maps via tensor voting R Wang, N Chen IEEE Transactions on Semiconductor Manufacturing 35 (3), 485-494, 2022 | 12 | 2022 |
| Spatial correlated data monitoring in semiconductor manufacturing using Gaussian process model R Wang, L Zhang, N Chen IEEE Transactions on Semiconductor Manufacturing 32 (1), 104-111, 2018 | 12 | 2018 |
| Clustering subway station arrival patterns using weighted dynamic time warping R Wang, N Chen, C Zhang 2018 IEEE International Conference on Industrial Engineering and Engineering …, 2018 | 5 | 2018 |
| Tensor voting based similarity matching of wafer bin maps in semiconductor manufacturing R Wang, S Wang 2022 5th International Conference on Data Science and Information Technology …, 2022 | 1 | 2022 |
| A Plane-Based LiDAR Odometry Method for Man-Made Scene Z Yan, P Li, R Wang, B Chen 2023 62nd IEEE Conference on Decision and Control (CDC), 4223-4228, 2023 | | 2023 |
| Shape prior guided defect pattern classification and segmentation in wafer bin maps R Wang, S Wang, B Niu Journal of Intelligent Manufacturing, 1-12, 2023 | | 2023 |
| Similarity searching for fault diagnosis of defect patterns in wafer bin maps R Wang, S Wang Computers & Industrial Engineering 185, 109679, 2023 | | 2023 |
| Multi-Scale and Multi-Branch Transformer Network for Remaining Useful Life Prediction in Ion Mill Etching Process Z Yuan, R Wang IEEE Transactions on Semiconductor Manufacturing, 2023 | | 2023 |
| A Squeeze-and-Excitation and Transformer Based Model for Remaining Useful Life Prediction in Ion Mill Etching Process Z Yuan, R Wang 2023 IEEE 19th International Conference on Automation Science and …, 2023 | | 2023 |
| A Feature Ensemble Model for Material Rate Prediction in Chemical Mechanical Planarization R Wang 2021 IEEE International Conference on Industrial Engineering and Engineering …, 2021 | | 2021 |
| A B-Spline Based Gaussian Process Regression Approach for Fatigue Crack Length Estimation Using Ultrasonic Wave Data R Wang 2021 Global Reliability and Prognostics and Health Management (PHM-Nanjing), 1-6, 2021 | | 2021 |
