| Threshold voltage shift in organic field effect transistors by dipole monolayers on the gate insulator KP Pernstich, S Haas, D Oberhoff, C Goldmann, DJ Gundlach, B Batlogg, ... Journal of Applied Physics 96 (11), 6431-6438, 2004 | 645 | 2004 |
| Design and modeling of a high-speed AFM-scanner G Schitter, KJ Astrom, BE DeMartini, PJ Thurner, KL Turner, PK Hansma IEEE Transactions on control systems technology 15 (5), 906-915, 2007 | 442 | 2007 |
| The design of high performance mechatronics-: high-Tech functionality by multidisciplinary system integration RM Schmidt, G Schitter, A Rankers Ios Press, 2020 | 398 | 2020 |
| Sacrificial bonds and hidden length: unraveling molecular mesostructures in tough materials GE Fantner, E Oroudjev, G Schitter, LS Golde, P Thurner, MM Finch, ... Biophysical journal 90 (4), 1411-1418, 2006 | 374 | 2006 |
| High performance feedback for fast scanning atomic force microscopes G Schitter, P Menold, HF Knapp, F Allgöwer, A Stemmer Review of Scientific Instruments 72 (8), 3320-3327, 2001 | 353 | 2001 |
| A tutorial on the mechanisms, dynamics, and control of atomic force microscopes DY Abramovitch, SB Andersson, LY Pao, G Schitter 2007 American Control Conference, 3488-3502, 2007 | 306 | 2007 |
| Components for high speed atomic force microscopy GE Fantner, G Schitter, JH Kindt, T Ivanov, K Ivanova, R Patel, ... Ultramicroscopy 106 (8-9), 881-887, 2006 | 288 | 2006 |
| Design and input-shaping control of a novel scanner for high-speed atomic force microscopy G Schitter, PJ Thurner, PK Hansma Mechatronics 18 (5-6), 282-288, 2008 | 262 | 2008 |
| Identification and open-loop tracking control of a piezoelectric tube scanner for high-speed scanning-probe microscopy G Schitter, A Stemmer IEEE Transactions on Control Systems Technology 12 (3), 449-454, 2004 | 253 | 2004 |
| High-speed atomic force microscopy PK Hansma, G Schitter, GE Fantner, C Prater Science 314 (5799), 601-602, 2006 | 229 | 2006 |
| A new control strategy for high-speed atomic force microscopy G Schitter, F Allgöwer, A Stemmer Nanotechnology 15 (1), 108, 2003 | 214 | 2003 |
| MEMS-based lidar for autonomous driving HW Yoo, N Druml, D Brunner, C Schwarzl, T Thurner, M Hennecke, ... e & i Elektrotechnik und Informationstechnik, 2018 | 206 | 2018 |
| Scanning probe microscopy at video-rate G Schitter, MJ Rost Materials Today 11, 40-48, 2008 | 168 | 2008 |
| First observation of blending-zone morphology at interface of reclaimed asphalt binder and virgin bitumen SN Nahar, M Mohajeri, AJM Schmets, A Scarpas, MFC Van de Ven, ... Transportation research record 2370 (1), 1-9, 2013 | 161 | 2013 |
| High-speed photography of compressed human trabecular bone correlates whitening to microscopic damage PJ Thurner, B Erickson, R Jungmann, Z Schriock, JC Weaver, GE Fantner, ... Engineering fracture mechanics 74 (12), 1928-1941, 2007 | 160 | 2007 |
| State-space model of freely vibrating and surface-coupled cantilever dynamics in atomic force microscopy RW Stark, G Schitter, M Stark, R Guckenberger, A Stemmer Physical Review B 69 (8), 085412, 2004 | 152 | 2004 |
| Sacrificial bonds in the interfibrillar matrix of bone PK Hansma, GE Fantner, JH Kindt, PJ Thurner, G Schitter, PJ Turner, ... Journal of Musculoskeletal and Neuronal Interactions 5 (4), 313, 2005 | 136 | 2005 |
| Tuning the interaction forces in tapping mode atomic force microscopy RW Stark, G Schitter, A Stemmer Physical Review B 68 (8), 085401, 2003 | 125 | 2003 |
| Fast contact-mode atomic force microscopy on biological specimen by model-based control G Schitter, RW Stark, A Stemmer Ultramicroscopy 100 (3-4), 253-257, 2004 | 111 | 2004 |
| Turning back time: rheological and microstructural assessment of rejuvenated bitumen SN Nahar, J Qiu, AJM Schmets, E Schlangen, M Shirazi, MFC Van de Ven, ... Transportation Research Record 2444 (1), 52-62, 2014 | 107 | 2014 |
Ernst CsencsicsAssociate Professor for Measurement Systems, TU WienПодтвержден адрес электронной почты в домене acin.tuwien.ac.at
