Charge pump with perfect current matching characteristics in phase-locked loops JS Lee, MS Keel, SI Lim, S Kim
Electronics letters 36 (23), 1907-1908, 2000
375 2000 An energy-efficient VLSI architecture for pattern recognition via deep embedding of computation in SRAM M Kang, MS Keel, NR Shanbhag, S Eilert, K Curewitz
2014 IEEE International Conference on Acoustics, Speech and Signal …, 2014
213 2014 A VGA Indirect Time-of-Flight CMOS Image Sensor With 4-Tap 7- MS Keel, YG Jin, Y Kim, D Kim, Y Kim, M Bae, B Chung, S Son, H Kim, ...
IEEE Journal of Solid-State Circuits 55 (4), 889-897, 2019
50 2019 An energy-efficient memory-based high-throughput VLSI architecture for convolutional networks M Kang, SK Gonugondla, MS Keel, NR Shanbhag
2015 IEEE International Conference on Acoustics, Speech and Signal …, 2015
48 2015 Compute memory N Shanbhag, MG Kang, MS Keel
US Patent 9,697,877, 2017
47 2017 Energy-efficient and high throughput sparse distributed memory architecture M Kang, EP Kim, M Keel, NR Shanbhag
2015 IEEE International Symposium on Circuits and Systems (ISCAS), 2505-2508, 2015
40 2015 7.1 A 4-tap 3.5 μm 1.2 Mpixel indirect time-of-flight CMOS image sensor with peak current mitigation and multi-user interference cancellation MS Keel, D Kim, Y Kim, M Bae, M Ki, B Chung, S Son, H Lee, H Jo, ...
2021 IEEE International Solid-State Circuits Conference (ISSCC) 64, 106-108, 2021
37 2021 A 640× 480 indirect time-of-flight CMOS image sensor with 4-tap 7-μm global-shutter pixel and fixed-pattern phase noise self-compensation scheme MS Keel, YG Jin, Y Kim, D Kim, Y Kim, M Bae, B Chung, S Son, H Kim, ...
2019 Symposium on VLSI Circuits, C258-C259, 2019
26 2019 Custom test chip for system-level ESD investigations N Thomson, Y Xiu, R Mertens, MS Keel, E Rosenbaum
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014, 1-10, 2014
24 2014 A 1.2-Mpixel Indirect Time-of-Flight Image Sensor With 4-Tap 3.5-μ m Pixels for Peak Current Mitigation and Multi-User Interference Cancellation MS Keel, D Kim, Y Kim, M Bae, M Ki, B Chung, S Son, H Lee, SC Shin, ...
IEEE Journal of Solid-State Circuits 56 (11), 3209-3219, 2021
19 2021 A study of BER-optimal ADC-based receiver for serial links Y Lin, MS Keel, A Faust, A Xu, NR Shanbhag, E Rosenbaum, AC Singer
IEEE Transactions on Circuits and Systems I: Regular Papers 63 (5), 693-704, 2016
17 2016 A 2.8 μm pixel for time of flight CMOS image sensor with 20 ke-full-well capacity in a tap and 36% quantum efficiency at 940 nm wavelength Y Kwon, S Seo, S Cho, SH Choi, T Hwang, Y Kim, YG Jin, Y Oh, MS Keel, ...
2020 IEEE International Electron Devices Meeting (IEDM), 33.2. 1-33.2. 4, 2020
16 2020 Correlated double sampling circuit MS Keel, KH Lee
US Patent 7,919,993, 2011
15 2011 A 4-tap global shutter pixel with enhanced IR sensitivity for VGA time-of-flight CMOS image sensors T Jung, Y Kwon, S Seo, MS Keel, C Lee, SH Choi, SY Kim, S Cho, Y Kim, ...
Electronic Imaging 32, 1-6, 2020
13 2020 CDM-reliable T-coil techniques for a 25-Gb/s wireline receiver front-end MS Keel, E Rosenbaum
IEEE Transactions on Device and Materials Reliability 16 (4), 513-520, 2016
13 2016 ESD protection networks for 3D integrated circuits E Rosenbaum, V Shukla, MS Keel
2011 IEEE International 3D Systems Integration Conference (3DIC), 2011 IEEE …, 2012
13 2012 CMOS delta-sigma frequency synthesizer with a new frequency divider and a simplified MASH structure SH Kim, MS Keel, KW Lee, SK Kim, SI Lim
Journal of the Korean Physical Society 41 (6), 967, 2002
12 2002 A 140 dB single-exposure dynamic-range CMOS image sensor with in-Pixel DRAM capacitor Y Oh, J Lim, S Park, D Yoo, M Lim, J Park, S Kim, M Jung, S Kim, J Lee, ...
2022 International Electron Devices Meeting (IEDM), 37.7. 1-37.7. 4, 2022
11 2022 Time of flight sensor, a three-dimensional imaging device using the same, and a method for driving the three-dimensional imaging device MS Keel, G Bitan, A Eisenberg
US Patent 11,378,690, 2022
9 2022 CDM-reliable T-coil techniques for high-speed wireline receivers MS Keel, E Rosenbaum
2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD …, 2015
9 2015 
Seung Chul Shin, Ph.D.Samsung ElectronicsПодтвержден адрес электронной почты в домене samsung.com
