| Intrinsic halide segregation at nanometer scale determines the high efficiency of mixed cation/mixed halide perovskite solar cells P Gratia, G Grancini, JN Audinot, X Jeanbourquin, E Mosconi, ... Journal of the American Chemical Society 138 (49), 15821-15824, 2016 | 214 | 2016 |
| The many faces of mixed ion perovskites: unraveling and understanding the crystallization process P Gratia, I Zimmermann, P Schouwink, JH Yum, JN Audinot, K Sivula, ... ACS Energy Letters 2 (12), 2686-2693, 2017 | 200 | 2017 |
| A passivating contact for silicon solar cells formed during a single firing thermal annealing A Ingenito, G Nogay, Q Jeangros, E Rucavado, C Allebé, S Eswara, ... Nature Energy 3 (9), 800-808, 2018 | 134 | 2018 |
| High-resolution high-sensitivity elemental imaging by secondary ion mass spectrometry: from traditional 2D and 3D imaging to correlative microscopy T Wirtz, P Philipp, JN Audinot, D Dowsett, S Eswara Nanotechnology 26 (43), 434001, 2015 | 121 | 2015 |
| Correlative microscopy combining secondary ion mass spectrometry and electron microscopy: comparison of intensity–hue–saturation and Laplacian pyramid methods for image fusion F Vollnhals, JN Audinot, T Wirtz, M Mercier-Bonin, I Fourquaux, ... Analytical chemistry 89 (20), 10702-10710, 2017 | 90 | 2017 |
| Imaging and analytics on the helium ion microscope T Wirtz, O De Castro, JN Audinot, P Philipp Annual Review of Analytical Chemistry 12, 523-543, 2019 | 85 | 2019 |
| Co-registered in situ secondary electron and mass spectral imaging on the helium ion microscope demonstrated using lithium titanate and magnesium oxide nanoparticles D Dowsett, T Wirtz Analytical Chemistry 89 (17), 8957-8965, 2017 | 80 | 2017 |
| Towards secondary ion mass spectrometry on the helium ion microscope: An experimental and simulation based feasibility study with He+ and Ne+ bombardment T Wirtz, N Vanhove, L Pillatsch, D Dowsett, S Sijbrandij, J Notte Applied Physics Letters 101 (4), 2012 | 67 | 2012 |
| Elemental mapping of neuromelanin organelles of human substantia nigra: Correlative ultrastructural and chemical analysis by analytical transmission electron microscopy and … A Biesemeier, O Eibl, S Eswara, JN Audinot, T Wirtz, G Pezzoli, FA Zucca, ... Journal of Neurochemistry 138 (2), 339-353, 2016 | 56 | 2016 |
| SIMS analysis with neutral cesium deposition: Negative secondary ion sensitivity increase and quantification aspects P Philipp, T Wirtz, HN Migeon, H Scherrer International Journal of Mass Spectrometry 253 (1-2), 71-78, 2006 | 53 | 2006 |
| Improved efficiency and reduced hysteresis in ultra-stable fully printable mesoscopic perovskite solar cells through incorporation of CuSCN into the perovskite layer I Zimmermann, P Gratia, D Martineau, G Grancini, JN Audinot, T Wirtz, ... Journal of materials chemistry A 7 (14), 8073-8077, 2019 | 51 | 2019 |
| Analysis of hydrogen distribution and migration in fired passivating contacts (FPC) M Lehmann, N Valle, J Horzel, A Pshenova, P Wyss, M Döbeli, ... Solar Energy Materials and Solar Cells 200, 110018, 2019 | 49 | 2019 |
| Study and optimisation of SIMS performed with He+ and Ne+ bombardment L Pillatsch, N Vanhove, D Dowsett, S Sijbrandij, J Notte, T Wirtz Applied surface science 282, 908-913, 2013 | 49 | 2013 |
| In vitro exposure of a 3D-tetraculture representative for the alveolar barrier at the air-liquid interface to silver particles and nanowires I Fizeșan, S Cambier, E Moschini, A Chary, I Nelissen, J Ziebel, ... Particle and fibre toxicology 16, 1-21, 2019 | 41 | 2019 |
| Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional … T Wirtz, Y Fleming, M Gerard, U Gysin, T Glatzel, E Meyer, U Wegmann, ... Review of Scientific Instruments 83 (6), 2012 | 39 | 2012 |
| Combined SIMS‐SPM instrument for high sensitivity and high‐resolution elemental 3D analysis T Wirtz, Y Fleming, U Gysin, T Glatzel, U Wegmann, E Meyer, U Maier, ... Surface and interface analysis 45 (1), 513-516, 2013 | 37 | 2013 |
| Correlative microscopy combining transmission electron microscopy and secondary ion mass spectrometry: A general review on the state-of-the-art, recent developments, and prospects S Eswara, A Pshenova, L Yedra, QH Hoang, J Lovric, P Philipp, T Wirtz Applied Physics Reviews 6 (2), 2019 | 36 | 2019 |
| SIMS on the helium ion microscope: A powerful tool for high-resolution high-sensitivity nano-analytics T Wirtz, D Dowsett, P Philipp Helium Ion Microscopy, 297-323, 2016 | 36 | 2016 |
| Combed single DNA molecules imaged by secondary ion mass spectrometry A Cabin-Flaman, AF Monnier, Y Coffinier, JN Audinot, D Gibouin, T Wirtz, ... Analytical Chemistry 83 (18), 6940-6947, 2011 | 35 | 2011 |
| Work function shifts and variations of ionization probabilities occurring during SIMS analyses using an in situ deposition of Cs0 T Wirtz, HN Migeon Surface science 561 (2-3), 200-207, 2004 | 35 | 2004 |
