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Co-authors
- Haining WangProfessor of ECE, Virginia TechVerified email at vt.edu
- Zhongshu GuIBM ResearchVerified email at us.ibm.com
- Cong WangZhejiang UniversityVerified email at zju.edu.cn
- Angelos StavrouProfessor at Virginia TechVerified email at vt.edu
- Daiping LiuPalo Alto NetworksVerified email at udel.edu
- Kun SunGeorge Mason UniversityVerified email at gmu.edu
- Jidong XiaoRensselaer Polytechnic InstituteVerified email at rpi.edu
- Guannan LiuAssistant Professor at Colorado School of MinesVerified email at mines.edu
- Zhenkai ZhangClemson UniversityVerified email at clemson.edu
- Fan YaoUniversity of Central FloridaVerified email at ucf.edu
- Haixin Duan, 段海新Tsinghua UniversityVerified email at tsinghua.edu.cn
- Yacong GuTsinghua UniversityVerified email at tsinghua.edu.cn
- Chase CottonProfessor, Electrical and Computer Engineering, University of Delaware; CISSPVerified email at udel.edu
- Chengmo YangAssociate Professor of Electrical and Computer Engineering, University of DelawareVerified email at udel.edu
- Fengwei ZhangAssociate Professor, Southern University of Science and TechnologyVerified email at sustech.edu.cn
- Xiaofan LiUniversity of DelawareVerified email at udel.edu
- Rong GeProfessor, Clemson UniversityVerified email at clemson.edu
- Tyler AllenUNC CharlotteVerified email at charlotte.edu
- Shuai WangThe Hong Kong University of Science and TechnologyVerified email at cse.ust.hk
- Wenjie XiongVirginia TechVerified email at vt.edu