| From online fault detection to fault management in Network-on-Chips: A ground-up approach SP Azad, B Niazmand, K Janson, N George, AS Oyeniran, T Putkaradze, ... 2017 IEEE 20th International Symposium on Design and Diagnostics of …, 2017 | 23 | 2017 |
| High-level modeling and testing of multiple control faults in digital systems A Jasnetski, SA Oyeniran, A Tsertov, M Schölzel, R Ubar 2016 IEEE 19th International Symposium on Design and Diagnostics of …, 2016 | 15 | 2016 |
| Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation AS Oyeniran, SP Azad, R Ubar 2018 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2018 | 11 | 2018 |
| Multiple fault testing in systems-on-chip with high-level decision diagrams R Ubar, SA Oyeniran, M Scholzel, HT Vierhaus 2015 10th International Design & Test Symposium (IDT), 66-71, 2015 | 10 | 2015 |
| High-level test generation for processing elements in many-core systems AS Oyeniran, R Ubar, SP Azad, J Raik 2017 12th International Symposium on Reconfigurable Communication-centric …, 2017 | 8 | 2017 |
| High-level implementation-independent functional software-based self-test for RISC processors AS Oyeniran, R Ubar, M Jenihhin, J Raik Journal of Electronic Testing 36 (1), 87-103, 2020 | 6 | 2020 |
| Application specific true critical paths identification in sequential circuits L Jürimägi, R Ubar, M Jenihhin, J Raik, S Devadze, AS Oyeniran 2019 IEEE 25th International Symposium on On-Line Testing and Robust System …, 2019 | 6 | 2019 |
| Combined pseudo-exhaustive and deterministic testing of array multipliers AS Oyeniran, SP Azad, R Ubar 2018 IEEE International Conference on Automation, Quality and Testing …, 2018 | 6 | 2018 |
| Implementation-independent functional test for transition delay faults in microprocessors AS Oyeniran, R Ubar, M Jenihhin, J Raik 2020 23rd Euromicro Conference on Digital System Design (DSD), 646-650, 2020 | 5 | 2020 |
| New categories of Safe Faults in a processor-based Embedded System C Gursoy, M Jenihhin, AS Oyeniran, D Piumatti, J Raik, MS Reorda, ... 2019 IEEE 22nd International Symposium on Design and Diagnostics of …, 2019 | 5 | 2019 |
| Double phase fault collapsing with linear complexity in digital circuits R Ubar, L Jürimägi, E Orasson, G Josifovska, SA Oyeniran 2015 Euromicro Conference on Digital System Design, 700-705, 2015 | 5 | 2015 |
| Environment for innovative university research training in the field of digital test AS Oyeniran, T Ademilua, M Kruus, R Ubar 2021 30th Annual Conference of the European Association for Education in …, 2021 | 3 | 2021 |
| On Test Generation for Microprocessors for Extended Class of Functional Faults AS Oyeniran, R Ubar, M Jenihhin, J Raik VLSI-SoC: New Technology Enabler: 27th IFIP WG 10.5/IEEE International …, 2020 | 3 | 2020 |
| High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors AS Oyeniran, R Ubar, M Jenihhin, CC Gürsoy, J Raik 2019 IEEE European Test Symposium (ETS), 1-6, 2019 | 3 | 2019 |
| Mixed-level identification of fault redundancy in microprocessors AS Oyeniran, R Ubar, M Jenihhin, CC Gürsoy, J Raik 2019 IEEE Latin American Test Symposium (LATS), 1-6, 2019 | 3 | 2019 |
| Software-Based Self-Test with Decision Diagrams for Microprocessors R Ubar, AJ Tsertov, AS Oyeniran LAP LAMBERT Academic Publishing, 2018 | 3 | 2018 |
| High-level test data generation for software-based self-test in microprocessors AS Oyeniran, A Jasnetski, A Tsertov, R Ubar 2017 6th Mediterranean Conference on Embedded Computing (MECO), 1-6, 2017 | 3 | 2017 |
| A new measure for calculating multiple fault coverage of microprocessor self-test AS Oyeniran, UE Odozi, R Ubar 2016 15th Biennial Baltic Electronics Conference (BEC), 75-78, 2016 | 3 | 2016 |
| Implementation-Independent Functional Test Generation for RISC Microprocessors AS Oyeniran, R Ubar, M Jenihhin, J Raik 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration …, 2019 | 2 | 2019 |
| Multiple control fault testing in digital systems with high-level decision diagrams R Ubar, SA Oyeniran 2016 IEEE International Conference on Automation, Quality and Testing …, 2016 | 2 | 2016 |
Raimund UbarProfessor of Computer Engineering, Tallinn University of TechnologyVerified email at pld.ttu.ee
