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Vyacheslav Yarmolik
Vyacheslav Yarmolik
Professor of Computer Science, WI PB, BSUIR
Verified email at bsuir.by
Title
Cited by
Cited by
Year
March LR: A test for realistic linked faults
AJ van de Goor, GN Gaydadjiev, VG Mikitjuk, VN Yarmolik
Proceedings of 14th VLSI Test Symposium, 272-280, 1996
1711996
Контроль и диагностика цифровых узлов ЭВМ
ВН Ярмолик
Наука и техника, 1988
1121988
Generation and application of pseudorandom sequences for random testing
VN Yarmolik, SN Demidenko
John Wiley & Sons, Inc., 1988
1081988
Физически неклонируемые функции
ВН Ярмолик, ЮГ Вашинко
Информатика, 92-103, 2011
56*2011
Генерирование и применение псевдослучайных сигналов в системах испытания и контроля
ВН Ярмолик, СН Демиденко
Мн Наука и техника, 1986
561986
Transparent memory testing for pattern sensitive faults
MG Karpovsky, VN Yarmolik
Proceedings., International Test Conference, 860-869, 1995
521995
Efficient online and offline testing of embedded DRAMs
S Hellebrand, HJ Wunderlich, AA Ivaniuk, YV Klimets, VN Yarmolik
IEEE Transactions on Computers 51 (7), 801-809, 2002
512002
RAM testing algorithms for detection multiple linked faults
VG Mikitjuk, VN Yarmolik, AJ Van De Goor
Proceedings ED&TC European design and test conference, 435-439, 1996
511996
March PS (23N) test for DRAM pattern-sensitive faults
V Yarmolik, Y Klimets, S Demidenko
Proceedings Seventh Asian Test Symposium (ATS'98)(Cat. No. 98TB100259), 354-357, 1998
491998
Obfuscation as intellectual rights protection in VHDL language
M Brzozowski, VN Yarmolik
6th International Conference on Computer Information Systems and Industrial …, 2007
462007
Symmetric transparent BIST for RAMs
VN Yarmolik, S Hellebrand
Design, Automation and Test in Europe Conference and Exhibition, 1999 …, 1999
451999
Transparent memory BIST
MG Karpovsky, VN Yarmolik
Proceedings of IEEE International Workshop on Memory Technology, Design, and …, 1994
451994
March LA: a test for linked memory faults.
AJ van de Goor, G Gaydadjiev, VN Yarmolik, VG Mikitjuk
ED&TC, 627, 1997
431997
Self-adjusting output data compression: An efficient BIST technique for RAMs
VN Yarmolik, S Hellebrand, HJ Wunderlich
Proceedings Design, Automation and Test in Europe, 173-179, 1998
411998
RAM diagnostic tests
V Yarmolik
371996
Iterative antirandom testing
I Mrozek, VN Yarmolik
Journal of Electronic Testing 28, 301-315, 2012
352012
Pseudo-exhaustive word-oriented DRAM testing
MG Karpovsky, AJ van de Goor, VN Yarmolik
Proceedings the European Design and Test Conference. ED&TC 1995, 126-132, 1995
351995
Fault diagnosis of digital circuits
VN Yarmolik
John Wiley & Sons, Inc.Chichester, 1990
341990
Маршевые тесты для самотестирования ОЗУ
СВ Ярмолик, АП Занкович, АА Иванюк
Минск: Издательский центр БГУ, 2009
322009
Методы минимизации энергопотребления при самотестировании цифровых устройств
ИА Мурашко, ВН Ярмолик
Минск. Бестпринт, 2004
302004
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