| A frequency domain approach to registration of aliased images with application to super-resolution P Vandewalle, S Süsstrunk, M Vetterli EURASIP Journal on applied signal processing 2006, 233-233, 2006 | 731 | 2006 |
| Reproducible research in signal processing P Vandewalle, J Kovačević, M Vetterli Signal Processing Magazine, IEEE 26 (3), 37-47, 2009 | 386 | 2009 |
| Super-resolution from unregistered and totally aliased signals using subspace methods P Vandewalle, L Sbaiz, J Vandewalle, M Vetterli IEEE Transactions on Signal Processing 55 (7), 3687-3703, 2007 | 148 | 2007 |
| Code Sharing Is Associated with Research Impact in Image Processing P Vandewalle Computing in Science & Engineering 14 (4), 42-47, 2012 | 99 | 2012 |
| Superresolution images reconstructed from aliased images P Vandewalle, S Susstrunk, M Vetterli SPIE/IS&T visual communication and image processing conference 5150, 1398-1405, 2003 | 83 | 2003 |
| Super-resolution from unregistered aliased images P Vandewalle Ecole Polytechnique Fédérale de Lausanne, 2006 | 52 | 2006 |
| How to take advantage of aliasing in bandlimited signals P Vandewalle, L Sbaiz, J Vandewalle, M Vetterli Acoustics, Speech, and Signal Processing, 2004. Proceedings.(ICASSP'04 …, 2004 | 44 | 2004 |
| Super-resolution from highly undersampled images P Vandewalle, L Sbaiz, M Vetterli, S Sustrunk IEEE International Conference on Image Processing 2005 1, I-889-92, 2005 | 40 | 2005 |
| Automatic red-eye removal based on sclera and skin tone detection F Volken, J Terrier, P Vandewalle Conference on Colour in Graphics, Imaging, and Vision 2006 (1), 359-364, 2006 | 39 | 2006 |
| Joint demosaicing and super-resolution imaging from a set of unregistered aliased images P Vandewalle, K Krichane, D Alleysson, S Süsstrunk IS&T/SPIE Electronic Imaging: Digital Photography III 6502, 2007 | 38 | 2007 |
| Double resolution from a set of aliased images P Vandewalle, S Süsstrunk, M Vetterli SPIE/IS&T Electronic Imaging Conference 5301, 2004.128-135, 2004 | 38 | 2004 |
| Deep learning based porosity segmentation in X-ray CT measurements of polymer additive manufacturing parts S Bellens, P Vandewalle, W Dewulf Procedia CIRP 96, 336-341, 2021 | 36 | 2021 |
| Display-independent 3D-TV production and delivery using the layered depth video format B Bartczak, P Vandewalle, O Grau, G Briand, J Fournier, P Kerbiriou, ... IEEE Transactions on Broadcasting 57 (2), 477-490, 2011 | 36 | 2011 |
| Depth Estimation From Monocular Images And Sparse Radar Using Deep Ordinal Regression Network CC Lo, P Vandewalle 2021 IEEE International Conference on Image Processing (ICIP), 3343-3347, 2021 | 33 | 2021 |
| Modelling of facial soft tissue growth for maxillofacial surgery planning environments P Vandewalle, F Schutyser, J Van Cleynenbreugel, P Suetens International Symposium on Surgery Simulation and Soft Tissue Modeling, 27-37, 2003 | 24 | 2003 |
| Evaluating conventional and deep learning segmentation for fast X-ray CT porosity measurements of polymer laser sintered AM parts S Bellens, GM Probst, M Janssens, P Vandewalle, W Dewulf Polymer Testing 110, 107540, 2022 | 21 | 2022 |
| Experiences with reproducible research in various facets of signal processing research P Vandewalle, G Barrenetxea, I Jovanovic, A Ridolfi, M Vetterli 2007 IEEE International Conference on Acoustics, Speech and Signal …, 2007 | 15 | 2007 |
| Semantic Extraction of Permanent Structures for the Reconstruction of Building Interiors from Point Clouds I Coudron, S Puttemans, T Goedemé, P Vandewalle Sensors 20 (23), 6916, 2020 | 14 | 2020 |
| Groebner basis methods for multichannel sampling with unknown offsets L Sbaiz, P Vandewalle, M Vetterli Applied and Computational Harmonic Analysis 25 (3), 277-294, 2008 | 14 | 2008 |
| Multidimensional image enhancement from a set of unregistered and differently exposed images AA Rad, L Meylan, P Vandewalle, S Süsstrunk Proc. IS&T/SPIE Electronic Imaging: Computational Imaging V 6498, 3, 2007 | 14 | 2007 |
martin vetterliProfessor of computer and communication science, Ecole Polytechnique Federale LausanneVerified email at epfl.ch
